Influence of Vacuum Ultraviolet Radiation on Changes in Fourier-Transform Infrared Absorption Spectra and Electrical and Hydrophobic Properties of a Composite Based on Polyimide Track Membranes Filled with Silica
N. I. Cherkashina, V. I. Pavlenko, A. Y. Ruchii, S. N. Domarev, E. V. Forova
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引用次数: 0
Abstract
Vacuum ultraviolet radiation is a part of ultraviolet radiation with a very short wavelength and is a component of cosmic radiation. Composite materials based on polyimide have great potential for protection against cosmic radiation. The paper presents the results of studies on the effect of vacuum ultraviolet radiation on a polyimide film, a polyimide track membrane, and a composite material based on the polyimide track membrane filled with silica nanofibers. Mass losses, dielectric properties, Fourier-transform infrared spectra, and wettability of the studied samples before and after vacuum ultraviolet irradiation were studied. It was found that the lowest mass losses during vacuum ultraviolet irradiation were observed in the composite material based on the polyimide track membrane filled with SiO2; the dielectric constant of the composite film after vacuum ultraviolet irradiation increased by 65.8%. It was established that the effect of vacuum ultraviolet radiation on the films under study was accompanied by destruction of a small number of the following bonds: C=O, C–O, C–C, and C–N. At the same time, vacuum ultraviolet radiation caused the least damage to the developed composite material. Contact angle analysis of the studied samples showed that the surface of the polyimide film, polyimide track membrane, and composite material remained hydrophilic after irradiation. No changes were detected in the structure of the film surface.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.