Kinetic Study of the Crystallization of Free and Contact Surfaces of Fe77Ni1Si9B13 Amorphous-Alloy Ribbons under Low-Temperature Annealing

IF 0.4 Q4 PHYSICS, CONDENSED MATTER
M. S. Konovalov, V. I. Lad’yanov, M. I. Mokrushina, A. A. Suslov, A. I. Shilyaev, S. A. Tereshkina, V. B. Ivanov
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Abstract

This study examines the differences in the crystallization kinetics of the free and contact sides of an Fe77Ni1Si9B13 amorphous-alloy ribbon at 400°C. X-ray phase analysis reveals that crystals based on α-Fe form on the contact side after just 5 min of annealing. In contrast, on the free side, reflections corresponding to α-Fe crystals are only detectable after 30 min of annealing. The relative content of the crystalline phase is determined using X-ray diffraction data, based on the relationship between the integral intensity of the reflection of the analyzed phase and its volume fraction. We explore the possible reasons for the observed differences in crystallization. Crystallization in the surface layers of both the contact and free sides of the ribbon occurs in two stages: the isotropic growth of existing nuclei with a decreasing rate of crystal formation, followed by the slowed anisotropic growth of already formed crystals. The first stage is satisfactorily described by the Johnson–Mehl–Avrami–Kolmogorov (JMAK) thermodynamic formalism, whereas applying a kinetic equation to describe the second stage is not appropriate.

Abstract Image

低温退火条件下 Fe77Ni1Si9B13 非晶合金带自由表面和接触表面结晶的动力学研究
本文研究了Fe77Ni1Si9B13非晶合金带在400℃时自由侧和接触侧结晶动力学的差异。x射线相分析表明,退火5 min后,接触侧形成了基于α-Fe的晶体。相比之下,在自由侧,α-Fe晶体对应的反射仅在退火30 min后才能检测到。根据被分析相的反射积分强度与其体积分数之间的关系,利用x射线衍射数据确定了晶相的相对含量。我们探讨了观察到的结晶差异的可能原因。接触面和自由面表面层的结晶发生在两个阶段:现有核的各向同性生长伴随着晶体形成速率的降低,随后是已经形成的晶体的各向异性生长的减慢。第一阶段可以用JMAK热力学公式满意地描述,而用动力学方程来描述第二阶段则不合适。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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