Theoretical Study of the Impact and Control of Topological Defects on the Electrical Properties of Single-Walled Carbon Nanotubes: Implications for Carbon-Based Transistor Regulation

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Xiaojing Wang, Qingyang Xu, Hangkong Ouyang, Lining Sun and Li Ma*, 
{"title":"Theoretical Study of the Impact and Control of Topological Defects on the Electrical Properties of Single-Walled Carbon Nanotubes: Implications for Carbon-Based Transistor Regulation","authors":"Xiaojing Wang,&nbsp;Qingyang Xu,&nbsp;Hangkong Ouyang,&nbsp;Lining Sun and Li Ma*,&nbsp;","doi":"10.1021/acsanm.4c0437610.1021/acsanm.4c04376","DOIUrl":null,"url":null,"abstract":"<p >Single-wall carbon nanotubes (SWCNTs) have unique electrical properties, making them potential silicon and copper replacements in semiconductors and nanointerconnects. Current research focuses on single vacancy defects, needing expansion to other topological defects. In this study, we account for the presence of topological defects and develop a model that demonstrates their impact on the electrical properties of carbon nanotubes (CNTs) by using a degradation coefficient for the conductivity. This study employs density functional theory combined with the nonequilibrium Green’s function method to systematically analyze the influence of various topological defects on the electronic structure and transport characteristics of SWCNTs, using <i>I–V</i> curves, transmission spectra, and 3D transmission spectra. The results indicate that defects of the same type substantially degrade the electronic transport properties of CNTs, with the degree of degradation varying based on the defects’ positions and quantities. This degradation can result in a reduction of over 20% in the electronic transport capacity compared with ideal CNTs. A linear positive correlation exists between the extent of degradation and the magnitude of the defects. Furthermore, the presence of a small number of 5–8–5 defects and Stone–Wales defects can induce bandgap opening from 0.109 to 0.549 eV for the bandgap of (6,6) CNTs. However, a high defect concentration reduces the bandgap, potentially to zero. Notably, regardless of whether the bandgap increases or decreases, the bandgap of (6,6) CNTs remains smaller than the bandgap of (11,0) semiconductor CNTs, leading to the transition of SWCNTs to metallic conductors. Finally, the differential conductivity diagram of CNTs with topological defects was analyzed, demonstrating that introducing specific 5–8–5 defects can effectively regulate the electrical properties of the CNTs. This paper analyzes the effects of defects on the CNTs electrical properties and finds a regulatory effect, providing a reference for carbon-based transistor manufacturing.</p>","PeriodicalId":6,"journal":{"name":"ACS Applied Nano Materials","volume":"7 23","pages":"26727–26736 26727–26736"},"PeriodicalIF":5.3000,"publicationDate":"2024-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Nano Materials","FirstCategoryId":"88","ListUrlMain":"https://pubs.acs.org/doi/10.1021/acsanm.4c04376","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
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Abstract

Single-wall carbon nanotubes (SWCNTs) have unique electrical properties, making them potential silicon and copper replacements in semiconductors and nanointerconnects. Current research focuses on single vacancy defects, needing expansion to other topological defects. In this study, we account for the presence of topological defects and develop a model that demonstrates their impact on the electrical properties of carbon nanotubes (CNTs) by using a degradation coefficient for the conductivity. This study employs density functional theory combined with the nonequilibrium Green’s function method to systematically analyze the influence of various topological defects on the electronic structure and transport characteristics of SWCNTs, using I–V curves, transmission spectra, and 3D transmission spectra. The results indicate that defects of the same type substantially degrade the electronic transport properties of CNTs, with the degree of degradation varying based on the defects’ positions and quantities. This degradation can result in a reduction of over 20% in the electronic transport capacity compared with ideal CNTs. A linear positive correlation exists between the extent of degradation and the magnitude of the defects. Furthermore, the presence of a small number of 5–8–5 defects and Stone–Wales defects can induce bandgap opening from 0.109 to 0.549 eV for the bandgap of (6,6) CNTs. However, a high defect concentration reduces the bandgap, potentially to zero. Notably, regardless of whether the bandgap increases or decreases, the bandgap of (6,6) CNTs remains smaller than the bandgap of (11,0) semiconductor CNTs, leading to the transition of SWCNTs to metallic conductors. Finally, the differential conductivity diagram of CNTs with topological defects was analyzed, demonstrating that introducing specific 5–8–5 defects can effectively regulate the electrical properties of the CNTs. This paper analyzes the effects of defects on the CNTs electrical properties and finds a regulatory effect, providing a reference for carbon-based transistor manufacturing.

Abstract Image

拓扑缺陷对单壁碳纳米管电性能影响及控制的理论研究:对碳基晶体管调控的启示
单壁碳纳米管(SWCNTs)具有独特的电性能,使其成为半导体和纳米互连中硅和铜的潜在替代品。目前的研究主要集中在单个空位缺陷上,需要扩展到其他拓扑缺陷。在本研究中,我们考虑了拓扑缺陷的存在,并开发了一个模型,通过使用电导率的降解系数来证明它们对碳纳米管(CNTs)电性能的影响。本研究采用密度泛函理论结合非平衡格林函数方法,利用I-V曲线、透射光谱和三维透射光谱,系统分析了各种拓扑缺陷对SWCNTs电子结构和输运特性的影响。结果表明,相同类型的缺陷会对CNTs的电子输运性质造成严重的破坏,破坏程度随缺陷的位置和数量的不同而不同。与理想的碳纳米管相比,这种降解可导致电子输运能力降低20%以上。退化程度和缺陷大小之间存在线性正相关关系。此外,少量5-8-5缺陷和Stone-Wales缺陷的存在可以诱导(6,6)CNTs的带隙打开0.109 ~ 0.549 eV。然而,高缺陷浓度会降低带隙,有可能降至零。值得注意的是,无论带隙增大还是减小,(6,6)CNTs的带隙始终小于(11,0)半导体CNTs的带隙,导致SWCNTs向金属导体转变。最后,分析了具有拓扑缺陷的CNTs的电导率差图,表明引入特定的5-8-5缺陷可以有效调节CNTs的电性能。本文分析了缺陷对碳纳米管电性能的影响,发现了其调控效应,为碳基晶体管的制造提供了参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
8.30
自引率
3.40%
发文量
1601
期刊介绍: ACS Applied Nano Materials is an interdisciplinary journal publishing original research covering all aspects of engineering, chemistry, physics and biology relevant to applications of nanomaterials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials, engineering, physics, bioscience, and chemistry into important applications of nanomaterials.
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