Theoretical Study of the Impact and Control of Topological Defects on the Electrical Properties of Single-Walled Carbon Nanotubes: Implications for Carbon-Based Transistor Regulation

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Xiaojing Wang, Qingyang Xu, Hangkong Ouyang, Lining Sun and Li Ma*, 
{"title":"Theoretical Study of the Impact and Control of Topological Defects on the Electrical Properties of Single-Walled Carbon Nanotubes: Implications for Carbon-Based Transistor Regulation","authors":"Xiaojing Wang,&nbsp;Qingyang Xu,&nbsp;Hangkong Ouyang,&nbsp;Lining Sun and Li Ma*,&nbsp;","doi":"10.1021/acsanm.4c0437610.1021/acsanm.4c04376","DOIUrl":null,"url":null,"abstract":"<p >Single-wall carbon nanotubes (SWCNTs) have unique electrical properties, making them potential silicon and copper replacements in semiconductors and nanointerconnects. Current research focuses on single vacancy defects, needing expansion to other topological defects. In this study, we account for the presence of topological defects and develop a model that demonstrates their impact on the electrical properties of carbon nanotubes (CNTs) by using a degradation coefficient for the conductivity. This study employs density functional theory combined with the nonequilibrium Green’s function method to systematically analyze the influence of various topological defects on the electronic structure and transport characteristics of SWCNTs, using <i>I–V</i> curves, transmission spectra, and 3D transmission spectra. The results indicate that defects of the same type substantially degrade the electronic transport properties of CNTs, with the degree of degradation varying based on the defects’ positions and quantities. This degradation can result in a reduction of over 20% in the electronic transport capacity compared with ideal CNTs. A linear positive correlation exists between the extent of degradation and the magnitude of the defects. Furthermore, the presence of a small number of 5–8–5 defects and Stone–Wales defects can induce bandgap opening from 0.109 to 0.549 eV for the bandgap of (6,6) CNTs. However, a high defect concentration reduces the bandgap, potentially to zero. Notably, regardless of whether the bandgap increases or decreases, the bandgap of (6,6) CNTs remains smaller than the bandgap of (11,0) semiconductor CNTs, leading to the transition of SWCNTs to metallic conductors. Finally, the differential conductivity diagram of CNTs with topological defects was analyzed, demonstrating that introducing specific 5–8–5 defects can effectively regulate the electrical properties of the CNTs. This paper analyzes the effects of defects on the CNTs electrical properties and finds a regulatory effect, providing a reference for carbon-based transistor manufacturing.</p>","PeriodicalId":6,"journal":{"name":"ACS Applied Nano Materials","volume":"7 23","pages":"26727–26736 26727–26736"},"PeriodicalIF":5.3000,"publicationDate":"2024-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Nano Materials","FirstCategoryId":"88","ListUrlMain":"https://pubs.acs.org/doi/10.1021/acsanm.4c04376","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

Abstract

Single-wall carbon nanotubes (SWCNTs) have unique electrical properties, making them potential silicon and copper replacements in semiconductors and nanointerconnects. Current research focuses on single vacancy defects, needing expansion to other topological defects. In this study, we account for the presence of topological defects and develop a model that demonstrates their impact on the electrical properties of carbon nanotubes (CNTs) by using a degradation coefficient for the conductivity. This study employs density functional theory combined with the nonequilibrium Green’s function method to systematically analyze the influence of various topological defects on the electronic structure and transport characteristics of SWCNTs, using I–V curves, transmission spectra, and 3D transmission spectra. The results indicate that defects of the same type substantially degrade the electronic transport properties of CNTs, with the degree of degradation varying based on the defects’ positions and quantities. This degradation can result in a reduction of over 20% in the electronic transport capacity compared with ideal CNTs. A linear positive correlation exists between the extent of degradation and the magnitude of the defects. Furthermore, the presence of a small number of 5–8–5 defects and Stone–Wales defects can induce bandgap opening from 0.109 to 0.549 eV for the bandgap of (6,6) CNTs. However, a high defect concentration reduces the bandgap, potentially to zero. Notably, regardless of whether the bandgap increases or decreases, the bandgap of (6,6) CNTs remains smaller than the bandgap of (11,0) semiconductor CNTs, leading to the transition of SWCNTs to metallic conductors. Finally, the differential conductivity diagram of CNTs with topological defects was analyzed, demonstrating that introducing specific 5–8–5 defects can effectively regulate the electrical properties of the CNTs. This paper analyzes the effects of defects on the CNTs electrical properties and finds a regulatory effect, providing a reference for carbon-based transistor manufacturing.

Abstract Image

求助全文
约1分钟内获得全文 求助全文
来源期刊
CiteScore
8.30
自引率
3.40%
发文量
1601
期刊介绍: ACS Applied Nano Materials is an interdisciplinary journal publishing original research covering all aspects of engineering, chemistry, physics and biology relevant to applications of nanomaterials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials, engineering, physics, bioscience, and chemistry into important applications of nanomaterials.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信