{"title":"High-performance UV photodetector based on β-Ga2O3/GaN heterojunction prepared by a new route of reverse substitution growth","authors":"Yurui Han, Yuefei Wang, Chong Gao, Shihao Fu, WeiZhe Cui, Zhe Wu, Bingsheng Li, Aidong Shen, Yichun Liu","doi":"10.1016/j.jmst.2024.11.032","DOIUrl":null,"url":null,"abstract":"A broad-spectrum UV photodetector with ultrahigh detectivity and rapid response speed has been achieved in <em>β</em>-Ga<sub>2</sub>O<sub>3</sub>/GaN heterojunction, in which, the <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> is synthesized by substituting oxygen for nitrogen in the top layer of the GaN matrix at high temperature. The processes and mechanism of transforming GaN with varying crystal quality into <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> at high temperatures were studied in detail. The newly formed oxide layer is a monoclinic <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> with (<span><math><mover accent=\"true\" is=\"true\"><mn is=\"true\">2</mn><mo is=\"true\">¯</mo></mover></math></span>01) preferred orientation. X-ray photoelectron spectroscopy (XPS) and atomic force microscope (AFM) measurements identified oxygen vacancies and surface flatness of <em>β</em>-Ga<sub>2</sub>O<sub>3</sub>, respectively, which are closely related to the crystal quality of GaN. The oxygen vacancies and the root mean square of morphology roughness of <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> decrease with the improvement of the precursor GaN crystal quality. The cross-section transmission electron microscope (TEM) measurements showed that a hexagonal phase GaN<sub>x</sub>O<sub>3(1−x)/2</sub> intermediate layer with a thickness of 5 nm exists at the interface region between <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> and hexagonal GaN. This indicates a molecular reconfiguration of the hexagonal system to a monoclinic system with oxygen substitution of nitrogen in GaN matrix. The metal-semiconductor-metal (MSM) planar structure device achieved an ultrahigh detection capability (Responsivity=2493.5 A/W, Detectivity>10<sup>16</sup> Jones). The response time is in the order of milliseconds (τ<sub>r</sub>=0.27 ms, τ<sub>d1/</sub>τ<sub>d2</sub>=0.33 ms/4.3 ms). A self-powered UV optoelectronic rapid response (τ<sub>r</sub>=5 μs, τ<sub>d1/</sub>τ<sub>d2</sub>=0.13 ms/2.3 ms) with the responsivity of 0.6 mA/W and the detectivity of 5.3×10<sup>11</sup> Jones in the solar-blind wavelength region has been observed in the <em>β</em>-Ga<sub>2</sub>O<sub>3</sub>/GaN heterojunction without external bias. With a bias of −10 V loading, the response of the photodetector becomes a broad spectrum, covering the UVA-UVC wavelength range, and the photoresponsivity is up to 13.5 A/W. The detectivity reaches a high value of 2.6×10<sup>15</sup> Jones.","PeriodicalId":16154,"journal":{"name":"Journal of Materials Science & Technology","volume":"49 1","pages":""},"PeriodicalIF":11.2000,"publicationDate":"2024-12-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science & Technology","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1016/j.jmst.2024.11.032","RegionNum":1,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
A broad-spectrum UV photodetector with ultrahigh detectivity and rapid response speed has been achieved in β-Ga2O3/GaN heterojunction, in which, the β-Ga2O3 is synthesized by substituting oxygen for nitrogen in the top layer of the GaN matrix at high temperature. The processes and mechanism of transforming GaN with varying crystal quality into β-Ga2O3 at high temperatures were studied in detail. The newly formed oxide layer is a monoclinic β-Ga2O3 with (01) preferred orientation. X-ray photoelectron spectroscopy (XPS) and atomic force microscope (AFM) measurements identified oxygen vacancies and surface flatness of β-Ga2O3, respectively, which are closely related to the crystal quality of GaN. The oxygen vacancies and the root mean square of morphology roughness of β-Ga2O3 decrease with the improvement of the precursor GaN crystal quality. The cross-section transmission electron microscope (TEM) measurements showed that a hexagonal phase GaNxO3(1−x)/2 intermediate layer with a thickness of 5 nm exists at the interface region between β-Ga2O3 and hexagonal GaN. This indicates a molecular reconfiguration of the hexagonal system to a monoclinic system with oxygen substitution of nitrogen in GaN matrix. The metal-semiconductor-metal (MSM) planar structure device achieved an ultrahigh detection capability (Responsivity=2493.5 A/W, Detectivity>1016 Jones). The response time is in the order of milliseconds (τr=0.27 ms, τd1/τd2=0.33 ms/4.3 ms). A self-powered UV optoelectronic rapid response (τr=5 μs, τd1/τd2=0.13 ms/2.3 ms) with the responsivity of 0.6 mA/W and the detectivity of 5.3×1011 Jones in the solar-blind wavelength region has been observed in the β-Ga2O3/GaN heterojunction without external bias. With a bias of −10 V loading, the response of the photodetector becomes a broad spectrum, covering the UVA-UVC wavelength range, and the photoresponsivity is up to 13.5 A/W. The detectivity reaches a high value of 2.6×1015 Jones.
期刊介绍:
Journal of Materials Science & Technology strives to promote global collaboration in the field of materials science and technology. It primarily publishes original research papers, invited review articles, letters, research notes, and summaries of scientific achievements. The journal covers a wide range of materials science and technology topics, including metallic materials, inorganic nonmetallic materials, and composite materials.