Robust Hardware Trojan Detection Method by Unsupervised Learning of Electromagnetic Signals

IF 2.8 2区 工程技术 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Daehyeon Lee;Junghee Lee;Younggiu Jung;Janghyuk Kauh;Taigon Song
{"title":"Robust Hardware Trojan Detection Method by Unsupervised Learning of Electromagnetic Signals","authors":"Daehyeon Lee;Junghee Lee;Younggiu Jung;Janghyuk Kauh;Taigon Song","doi":"10.1109/TVLSI.2024.3458892","DOIUrl":null,"url":null,"abstract":"This article explores the threat posed by Hardware Trojans (HTs), malicious circuits clandestinely embedded in hardware akin to software backdoors. Activation by attackers renders these Trojans capable of inducing malfunctions or leaking confidential information by manipulating the hardware’s normal operation. Despite robust software security, detecting and ensuring normal hardware operation becomes challenging in the presence of malicious circuits. This issue is particularly acute in weapon systems, where HTs can present a significant threat, potentially leading to immediate disablement in adversary countries. Given the severe risks associated with HTs, detection becomes imperative. The study focuses on demonstrating the efficacy of deep learning-based HT detection by comparing and analyzing methods using deep learning with existing approaches. This article proposes utilizing the deep support vector data description (Deep SVDD) model for HT detection. The proposed method outperforms existing methods when detecting untrained HTs. It achieves 92.87% of accuracy on average, which is higher than that of an existing method, 50.00%. This finding contributes valuable insights to the field of hardware security and lays the foundation for practical applications of Deep SVDD in real-world scenarios.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"32 12","pages":"2327-2340"},"PeriodicalIF":2.8000,"publicationDate":"2024-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10689630","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10689630/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0

Abstract

This article explores the threat posed by Hardware Trojans (HTs), malicious circuits clandestinely embedded in hardware akin to software backdoors. Activation by attackers renders these Trojans capable of inducing malfunctions or leaking confidential information by manipulating the hardware’s normal operation. Despite robust software security, detecting and ensuring normal hardware operation becomes challenging in the presence of malicious circuits. This issue is particularly acute in weapon systems, where HTs can present a significant threat, potentially leading to immediate disablement in adversary countries. Given the severe risks associated with HTs, detection becomes imperative. The study focuses on demonstrating the efficacy of deep learning-based HT detection by comparing and analyzing methods using deep learning with existing approaches. This article proposes utilizing the deep support vector data description (Deep SVDD) model for HT detection. The proposed method outperforms existing methods when detecting untrained HTs. It achieves 92.87% of accuracy on average, which is higher than that of an existing method, 50.00%. This finding contributes valuable insights to the field of hardware security and lays the foundation for practical applications of Deep SVDD in real-world scenarios.
通过电磁信号无监督学习的鲁棒硬件木马检测方法
本文探讨了硬件木马(HTs)带来的威胁,这种恶意电路被秘密嵌入硬件中,类似于软件后门。攻击者激活这些木马后,就能通过操纵硬件的正常运行来诱发故障或泄露机密信息。尽管有强大的软件安全保障,但在存在恶意电路的情况下,检测和确保硬件正常运行仍具有挑战性。这一问题在武器系统中尤为突出,因为有害电路可能会对武器系统构成重大威胁,导致敌国的武器系统立即瘫痪。鉴于与 HT 相关的严重风险,检测变得势在必行。本研究侧重于通过比较和分析使用深度学习的方法与现有方法,展示基于深度学习的 HT 检测的功效。本文提出利用深度支持向量数据描述(Deep SVDD)模型进行 HT 检测。在检测未经训练的 HT 时,所提出的方法优于现有方法。它的平均准确率达到 92.87%,高于现有方法的 50.00%。这一发现为硬件安全领域提供了宝贵的见解,并为深度 SVDD 在现实世界场景中的实际应用奠定了基础。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
CiteScore
6.40
自引率
7.10%
发文量
187
审稿时长
3.6 months
期刊介绍: The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society. Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels. To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信