{"title":"Challenges and progress in packaging materials for power modules with high operation temperature: Review","authors":"Shilin Zhao, Yan Tong, Chunbiao Wang, Erxian Yao","doi":"10.1007/s10854-024-14002-4","DOIUrl":null,"url":null,"abstract":"<div><p>Power semiconductor modules are increasingly applied in the electrical power conversion system, whose development has been characterized by increasing power density and higher operation (or junction) temperature. However, this development presents additional challenges for the packaging assembly of power modules, especially for the packaging materials since they are inevitably subjected to severe thermal loads. To design and manufacture high operation temperature power modules with excellent performance and reliability, a deep understanding of the effects of high temperature on the microstructure and properties of packaging materials and an awareness of the progress of novel packaging materials suitable for high-temperature conditions are necessary, which however, are still lack of systematic review. In this work, the critical packaging materials for power modules, <i>i.e.</i>, bonding wire, on-chip metallization layer, and solder alloys have been discussed with respect to the thermal-related failure modes and the corresponding failure mechanisms analyzed based on microstructure degradation and thermal–mechanical effects. The effects of increasing temperature on the reliability of packaging materials are also introduced. Moreover, solutions for improving the thermal performances of materials, the available optimized heat-resisting materials, and the development direction of packaging materials has been concluded and evaluated.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"35 35","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2024-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-024-14002-4","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Power semiconductor modules are increasingly applied in the electrical power conversion system, whose development has been characterized by increasing power density and higher operation (or junction) temperature. However, this development presents additional challenges for the packaging assembly of power modules, especially for the packaging materials since they are inevitably subjected to severe thermal loads. To design and manufacture high operation temperature power modules with excellent performance and reliability, a deep understanding of the effects of high temperature on the microstructure and properties of packaging materials and an awareness of the progress of novel packaging materials suitable for high-temperature conditions are necessary, which however, are still lack of systematic review. In this work, the critical packaging materials for power modules, i.e., bonding wire, on-chip metallization layer, and solder alloys have been discussed with respect to the thermal-related failure modes and the corresponding failure mechanisms analyzed based on microstructure degradation and thermal–mechanical effects. The effects of increasing temperature on the reliability of packaging materials are also introduced. Moreover, solutions for improving the thermal performances of materials, the available optimized heat-resisting materials, and the development direction of packaging materials has been concluded and evaluated.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.