Investigations on flexible dielectric material-based wearable antenna for tumor detection

IF 2.8 4区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Materials Science: Materials in Electronics Pub Date : 2024-12-07 DOI:10.1007/s10854-024-13953-y

T. A. Karthikeyan, M. Nesasudha, M. L. Valarmathi

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引用次数: 0

Abstract

In this paper, the design and comparative evaluation of five distinct substrate materials with variable relative permittivity values (2.71, 1.65, 1.51, 1.36, and 1.05), namely Polydimethylsiloxane (PDMS), Jean, Cotton, Felt, and Foam. The performance of the microstrip patch antenna is largely dependent on the dielectric materials used as the substrate and the patch shapes. Two approaches are used to carry out the analysis: in the first, five substrates with identical dimensions are used on the antenna and different frequencies are obtained. It is observed that when the dielectric constant decreases the frequency of the antenna shift towards right side. In the second method, to obtain the same frequency (2.45 GHz ISM band) five substrates with different dimensions are used on the antenna. Though the dimensions of the antenna varies but the number of Faces, Edges, and Vertices are same. The proposed antenna design is simulated in HFSS and Fabricated using synthesized PDMS substrate. The field overlays difference between the healthy and tumor affected phantom depicts the presence of tumor.

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来源期刊

Journal of Materials Science: Materials in Electronics 工程技术-材料科学：综合

CiteScore

5.00

自引率

7.10%

发文量

1931

审稿时长

2 months

期刊介绍： The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.