Growth and characterization of malonic acid-doped KDP single crystal

IF 2.8 4区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Materials Science: Materials in Electronics Pub Date : 2024-12-06 DOI:10.1007/s10854-024-13940-3

S. Amirsha Evangelin Kezia, N. Balasundari, A. Arulgnanam, K. Parvathi, P. Selvarajan

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引用次数: 0

Abstract

A single crystal of malonic acid-doped potassium dihydrogen phosphate (MAKDP) has been synthesized by the solution method with a slow evaporation technique. The grown single crystal's lattice parameters and crystal structure were resolved by using the single crystal X-ray diffraction analysis. The optical characteristics of the crystals, including transmission absorption and optical constants, were examined using UV–Visible spectroscopy. Kurtz–Perry powder technique was known to determine the second-harmonic generation efficiency. The chemical composition of the harvested crystal were characterized by EDAX analysis. Thermal stability and the melting point of MAKDP crystal have been analyzed by Thermogravimetric analysis (TGA), and differential thermal analysis (DTA) techniques. The luminescence of the MAKDP crystal is found out by using photoluminescence spectroscopy and cyclic voltammetry was also used to analyze the MAKDP crystal's electrochemical behavior. Also, the value of LDT has been found for the sample by using a Nd:YAG laser.

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来源期刊

Journal of Materials Science: Materials in Electronics 工程技术-材料科学：综合

CiteScore

5.00

自引率

7.10%

发文量

1931

审稿时长

2 months

期刊介绍： The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.