Spectral peak filtering using nonlinear polarization interferometer based on polarization maintaining fiber

IF 2.6 3区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Naoki Sakata, Shotaro Kitajima, Norihiko Nishizawa
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引用次数: 0

Abstract

Periodical spectral peaking is an attractive phenomenon for selecting optical frequency comb modes for highly sensitive comb spectroscopy. Here we proposed and demonstrated a spectral peak filtering technique using a nonlinear polarization interferometer (NPI). When we introduce an ultrashort pulse suffering from sharp absorption or phase modulation into the NPI, the ultrashort pulse and spectral peaks emerge from different output ports as a result of interference and the difference in nonlinear phase shift. The characteristics were examined both experimentally and numerically. Spectral peaks with a high signal-to-background ratio of 20 dB were obtained experimentally. The experimental results were almost in agreement with the numerical ones. The system consists of polarization-maintaining fiber devices and shows long-term stable operation. In principle, the proposed technique is applicable to any wavelength range and is useful for spectroscopic applications.
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来源期刊
Optical Fiber Technology
Optical Fiber Technology 工程技术-电信学
CiteScore
4.80
自引率
11.10%
发文量
327
审稿时长
63 days
期刊介绍: Innovations in optical fiber technology are revolutionizing world communications. Newly developed fiber amplifiers allow for direct transmission of high-speed signals over transcontinental distances without the need for electronic regeneration. Optical fibers find new applications in data processing. The impact of fiber materials, devices, and systems on communications in the coming decades will create an abundance of primary literature and the need for up-to-date reviews. Optical Fiber Technology: Materials, Devices, and Systems is a new cutting-edge journal designed to fill a need in this rapidly evolving field for speedy publication of regular length papers. Both theoretical and experimental papers on fiber materials, devices, and system performance evaluation and measurements are eligible, with emphasis on practical applications.
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