Effect of Au-deposited ceramic nanoparticles on SAC305/Cu solder joints

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Yuriy Plevachuk, Viktor Poverzhuk, Peter Švec Sr, Peter Švec, Lubomir Orovcik, Otto Bajana
{"title":"Effect of Au-deposited ceramic nanoparticles on SAC305/Cu solder joints","authors":"Yuriy Plevachuk,&nbsp;Viktor Poverzhuk,&nbsp;Peter Švec Sr,&nbsp;Peter Švec,&nbsp;Lubomir Orovcik,&nbsp;Otto Bajana","doi":"10.1007/s10854-024-13943-0","DOIUrl":null,"url":null,"abstract":"<div><p>This work considers ways to increase the stability of solder joints in a wide range of temperatures, which are extremely important in microelectronic devices. For this purpose, the effects of adding nanosized ceramic admixtures Al<sub>2</sub>O<sub>3</sub>, SiO<sub>2</sub>, TiO<sub>2</sub>, and ZrO<sub>2</sub> coated by Au into the Sn–3.5Ag–0.5Cu lead-free solder alloys on the microstructure and shear strength of the joints between the nanocomposite solder and a copper substrate were studied both at room temperature, as well as after a two-month exposure at sub-zero temperatures. The uncoated and Au-deposited ceramic nanoparticles were analyzed by transmission electron microscopy, and EDS elemental analysis reflected their distribution in the solder material. The microstructure analysis of the solder joints was carried out using the scanning electron microscope. The push-off experimental method was applied for determination of the shear strength, one of the most important mechanical properties of soldered joints. The obtained experimental results indicate that addition of the nanosized ceramic admixtures sputtered with gold to the basic solder matrix leads to a decrease in the growth rate of intermetallic layers in the soldered joints. The result is an improvement in the shear strength of these joints. Similar studies conducted after samples were kept for 2 months at 253 K (− 20 °C) did not lead to a significant deterioration of shear strength, which indicates their suitability to be used for soldering parts of microelectronic devices operating not only at room and elevated temperatures but also at sub-zero temperature range.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"35 34","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2024-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s10854-024-13943-0.pdf","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-024-13943-0","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

This work considers ways to increase the stability of solder joints in a wide range of temperatures, which are extremely important in microelectronic devices. For this purpose, the effects of adding nanosized ceramic admixtures Al2O3, SiO2, TiO2, and ZrO2 coated by Au into the Sn–3.5Ag–0.5Cu lead-free solder alloys on the microstructure and shear strength of the joints between the nanocomposite solder and a copper substrate were studied both at room temperature, as well as after a two-month exposure at sub-zero temperatures. The uncoated and Au-deposited ceramic nanoparticles were analyzed by transmission electron microscopy, and EDS elemental analysis reflected their distribution in the solder material. The microstructure analysis of the solder joints was carried out using the scanning electron microscope. The push-off experimental method was applied for determination of the shear strength, one of the most important mechanical properties of soldered joints. The obtained experimental results indicate that addition of the nanosized ceramic admixtures sputtered with gold to the basic solder matrix leads to a decrease in the growth rate of intermetallic layers in the soldered joints. The result is an improvement in the shear strength of these joints. Similar studies conducted after samples were kept for 2 months at 253 K (− 20 °C) did not lead to a significant deterioration of shear strength, which indicates their suitability to be used for soldering parts of microelectronic devices operating not only at room and elevated temperatures but also at sub-zero temperature range.

金沉积陶瓷纳米颗粒对 SAC305/Cu 焊点的影响
这项研究探讨了如何提高焊点在宽温度范围内的稳定性,这在微电子器件中极为重要。为此,研究了在 Sn-3.5Ag-0.5Cu无铅焊料合金中加入镀金的纳米陶瓷添加剂 Al2O3、SiO2、TiO2 和 ZrO2 对纳米复合焊料和铜基板之间焊点的微观结构和剪切强度的影响,既包括室温下的影响,也包括在零度以下暴露两个月后的影响。透射电子显微镜分析了未涂层和金沉积的陶瓷纳米颗粒,EDS 元素分析反映了它们在焊料中的分布。使用扫描电子显微镜对焊点的微观结构进行了分析。推压实验法用于测定剪切强度,这是焊点最重要的机械性能之一。实验结果表明,在基本焊料基体中加入溅射金的纳米陶瓷掺合料会降低焊点中金属间层的生长率。其结果是提高了这些焊点的剪切强度。将样品在 253 K(- 20 °C)温度下保存 2 个月后进行的类似研究并未导致剪切强度的显著下降,这表明它们不仅适用于在室温和高温下工作,也适用于在零下温度范围内工作的微电子设备部件的焊接。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信