{"title":"Optimization and performance analysis of n-ZnO/p-CdTe thin heterojunction solar cells via two-dimensional numerical simulation","authors":"Mohamed Manoua, Ahmed Liba","doi":"10.1016/j.rio.2024.100761","DOIUrl":null,"url":null,"abstract":"<div><div>The unique properties of cadmium telluride (CdTe) and zinc oxide (ZnO) semiconductors suggest promising photovoltaic performance for n-ZnO/p-CdTe heterojunctions. In this work, two-dimensional numerical simulation was utilized to study and optimize n-ZnO/p-CdTe thin heterojunction solar cells, aiming to demonstrate the highest achievable conversion efficiency for this simple structure. The effects of CdTe acceptor concentration, CdTe thickness, ZnO thickness, ZnO band-gap, ZnO donor concentration, defect density in ZnO layer, and interface defects density on the photovoltaic performance of n-ZnO/p-CdTe heterojunction were investigated under standard illumination conditions (AM1.5, 100 mW/cm<sup>2</sup>). The results revealed significant sensitivity of the photovoltaic performance to variations in CdTe acceptor and ZnO donor concentrations. Additionally, the optimal thicknesses for CdTe and ZnO were found to be 3 µm and 250 nm, respectively. Consequently, these optimal parameters yielded the following photovoltaic parameter values: J<sub>SC</sub> = 22.73 mA/cm<sup>2</sup>, V<sub>OC</sub> = 1.056 V, FF = 85.73 %, and η = 20.57 %, for a ZnO donor concentration of 10<sup>21</sup> cm<sup>−3</sup> and a CdTe acceptor concentration of 10<sup>17</sup> cm<sup>−3</sup>. The analysis of ZnO bandgap energy, adjusted through Mg doping, shown that a slight increase in efficiency occurs at a band gap of 3.75 eV, corresponding to about 20 % Mg content. However, these performances deteriorate significantly when the defect density in the ZnO layer exceeds 5 <span><math><mo>×</mo></math></span> 10<sup>15</sup> cm<sup>−3</sup> or when the interface defect density rises above 10<sup>12</sup> cm<sup>−2</sup>.</div></div>","PeriodicalId":21151,"journal":{"name":"Results in Optics","volume":"18 ","pages":"Article 100761"},"PeriodicalIF":0.0000,"publicationDate":"2024-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Results in Optics","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2666950124001585","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Physics and Astronomy","Score":null,"Total":0}
引用次数: 0
Abstract
The unique properties of cadmium telluride (CdTe) and zinc oxide (ZnO) semiconductors suggest promising photovoltaic performance for n-ZnO/p-CdTe heterojunctions. In this work, two-dimensional numerical simulation was utilized to study and optimize n-ZnO/p-CdTe thin heterojunction solar cells, aiming to demonstrate the highest achievable conversion efficiency for this simple structure. The effects of CdTe acceptor concentration, CdTe thickness, ZnO thickness, ZnO band-gap, ZnO donor concentration, defect density in ZnO layer, and interface defects density on the photovoltaic performance of n-ZnO/p-CdTe heterojunction were investigated under standard illumination conditions (AM1.5, 100 mW/cm2). The results revealed significant sensitivity of the photovoltaic performance to variations in CdTe acceptor and ZnO donor concentrations. Additionally, the optimal thicknesses for CdTe and ZnO were found to be 3 µm and 250 nm, respectively. Consequently, these optimal parameters yielded the following photovoltaic parameter values: JSC = 22.73 mA/cm2, VOC = 1.056 V, FF = 85.73 %, and η = 20.57 %, for a ZnO donor concentration of 1021 cm−3 and a CdTe acceptor concentration of 1017 cm−3. The analysis of ZnO bandgap energy, adjusted through Mg doping, shown that a slight increase in efficiency occurs at a band gap of 3.75 eV, corresponding to about 20 % Mg content. However, these performances deteriorate significantly when the defect density in the ZnO layer exceeds 5 1015 cm−3 or when the interface defect density rises above 1012 cm−2.