Bridging Mechanical and Electrical Analyses in AFM: Advances, Techniques, and Applications

Abstract

Microscopy has long expanded humanity’s understanding of the microscopic world, transcending limitations of the naked eye. The atomic force microscope (AFM), in particular, marks a major advancement in this field, enabling nanoscale investigations of materials through direct physical probing of their surface. Unlike traditional microscopes that use light or electrons, AFM’s unique methodology allows for both imaging on the atomic scale and precise manipulation of a material’s mechanical, electrical, and chemical properties. A key advantage also lies in its capacity for multimodal analysis, where multiple properties can be simultaneously measured to provide comprehensive insights into material behavior.