{"title":"Temporal denoising and deep feature learning for enhanced defect detection in thermography using stacked denoising convolution autoencoder","authors":"Naga Prasanthi Yerneni , V.S. Ghali , G.T. Vesala , Fei Wang , Ravibabu Mulaveesala","doi":"10.1016/j.infrared.2024.105612","DOIUrl":null,"url":null,"abstract":"<div><div>Thermal wave imaging uses the temporal temperature distribution over the object’s surface for subsurface analysis. However, the noise generated during experimentation corrupts this temporal history and hampers the detection of defect signatures. As denoising of the temporal thermal history enhances the defect detectability, this study offers a Stacked Denoising Convolution Autoencoder (SDCAE) in frequency-modulated thermal wave imaging with one-dimensional convolution layers to reduce noise in temporal thermal evolution and train high-level features resulting in improved defect signs. Experimental results on mild steel and carbon fiber reinforced polymer specimens with different sizes of defects at various depths demonstrate that integrating temporal denoising and deep feature learning techniques into a single novel framework significantly improved defect detectability. In addition, defect signal-to-noise ratios of the denoised thermal data and latent space of the proposed model compared to conventional autoencoder and dimensionality reduction techniques recommend the superiority of the proposed method.</div></div>","PeriodicalId":13549,"journal":{"name":"Infrared Physics & Technology","volume":"143 ","pages":"Article 105612"},"PeriodicalIF":3.1000,"publicationDate":"2024-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Infrared Physics & Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1350449524004961","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
Thermal wave imaging uses the temporal temperature distribution over the object’s surface for subsurface analysis. However, the noise generated during experimentation corrupts this temporal history and hampers the detection of defect signatures. As denoising of the temporal thermal history enhances the defect detectability, this study offers a Stacked Denoising Convolution Autoencoder (SDCAE) in frequency-modulated thermal wave imaging with one-dimensional convolution layers to reduce noise in temporal thermal evolution and train high-level features resulting in improved defect signs. Experimental results on mild steel and carbon fiber reinforced polymer specimens with different sizes of defects at various depths demonstrate that integrating temporal denoising and deep feature learning techniques into a single novel framework significantly improved defect detectability. In addition, defect signal-to-noise ratios of the denoised thermal data and latent space of the proposed model compared to conventional autoencoder and dimensionality reduction techniques recommend the superiority of the proposed method.
期刊介绍:
The Journal covers the entire field of infrared physics and technology: theory, experiment, application, devices and instrumentation. Infrared'' is defined as covering the near, mid and far infrared (terahertz) regions from 0.75um (750nm) to 1mm (300GHz.) Submissions in the 300GHz to 100GHz region may be accepted at the editors discretion if their content is relevant to shorter wavelengths. Submissions must be primarily concerned with and directly relevant to this spectral region.
Its core topics can be summarized as the generation, propagation and detection, of infrared radiation; the associated optics, materials and devices; and its use in all fields of science, industry, engineering and medicine.
Infrared techniques occur in many different fields, notably spectroscopy and interferometry; material characterization and processing; atmospheric physics, astronomy and space research. Scientific aspects include lasers, quantum optics, quantum electronics, image processing and semiconductor physics. Some important applications are medical diagnostics and treatment, industrial inspection and environmental monitoring.