Impact of Cr doping on Hall resistivity and magnetic anisotropy in SrRuO3 thin films.

IF 2.3 4区 物理与天体物理 Q3 PHYSICS, CONDENSED MATTER
Pooja Kesarwani, Santosh K Khetan, Brindaban Ojha, Ram Janay Choudhary, V R Reddy, Subhankar Bedanta, P S Anil Kumar, Chanchal Sow
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Abstract

Hall effects, including anomalous and topological types, in correlated ferromagnetic oxides provide an intriguing framework to investigate emergent phenomena arising from the interaction between spin-orbit coupling and magnetic fields. SrRuO3 is a widely studied itinerant ferromagnetic system with intriguing electronic and magnetic characteristics. The electronic transport of SrRuO3 is highly susceptible to the defects (O/Ru vacancy, chemical doping, ion implantation), and interfacial strain. In this regard, we investigate the impact of Cr doping on the magnetic anisotropy and the Hall effect in SrRuO3 thin films. The work encompasses a comprehensive analysis of the structural, spectroscopic, magnetic, and magnetotransport properties of Cr-doped SrRuO3 films grown on SrTiO3(001) substrates. Cross-sectional transmission electron microscopy reveals a sharp and coherent interface between the layers. Notably, perpendicular magnetic anisotropy is preserved in doped films with thicknesses up to 113 nm. The resistivity exhibits a T^2 dependence below the Curie temperature, reflecting the influence of disorder and correlation-induced localization effects. Interestingly, in contrast to the undoped parent compound SrRuO3, an anomaly in the Hall signal has been observed up to a large thickness (56 nm) attributed to the random Cr doping and Ru vacancy. Based on our measurements, a field-temperature (H -T) phase diagram of anomalous Hall resistivity is constructed.

铬掺杂对 SrRuO3 薄膜霍尔电阻率和磁各向异性的影响
相关铁磁氧化物中的霍尔效应(包括反常和拓扑类型)为研究自旋轨道耦合与磁场之间的相互作用所产生的新现象提供了一个有趣的框架。SrRuO3 是一种被广泛研究的巡回铁磁系统,具有引人入胜的电子和磁特性。SrRuO3 的电子传输极易受到缺陷(O/Ru 空位、化学掺杂、离子注入)和界面应变的影响。为此,我们研究了铬掺杂对 SrRuO3 薄膜磁各向异性和霍尔效应的影响。这项研究全面分析了在 SrTiO3(001) 基底上生长的掺杂铬的 SrRuO3 薄膜的结构、光谱、磁性和磁传输特性。横截面透射电子显微镜显示了层间尖锐而连贯的界面。值得注意的是,厚度达 113 nm 的掺杂薄膜保留了垂直磁各向异性。电阻率在居里温度以下表现出与 T^2 有关的特性,反映了无序和相关性引起的局部效应的影响。有趣的是,与未掺杂的母体化合物 SrRuO3 相反,在厚度较大(56 nm)的情况下,霍尔信号出现异常,这归因于随机 Cr 掺杂和 Ru 空位。根据我们的测量结果,构建了异常霍尔电阻率的场-温(H -T)相图。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Physics: Condensed Matter
Journal of Physics: Condensed Matter 物理-物理:凝聚态物理
CiteScore
5.30
自引率
7.40%
发文量
1288
审稿时长
2.1 months
期刊介绍: Journal of Physics: Condensed Matter covers the whole of condensed matter physics including soft condensed matter and nanostructures. Papers may report experimental, theoretical and simulation studies. Note that papers must contain fundamental condensed matter science: papers reporting methods of materials preparation or properties of materials without novel condensed matter content will not be accepted.
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