Joseph P. Briggs, Yinan Liu, P. Craig Taylor, Meenakshi Singh, Reuben T. Collins, Carolyn A. Koh
{"title":"Characterization of low sodium type II silicon clathrate film spin dynamics","authors":"Joseph P. Briggs, Yinan Liu, P. Craig Taylor, Meenakshi Singh, Reuben T. Collins, Carolyn A. Koh","doi":"10.1063/5.0230407","DOIUrl":null,"url":null,"abstract":"Type II Si clathrate is a Si-based, crystalline alternative to diamond silicon with interesting optoelectronic properties. Here, a pulsed electron paramagnetic resonance study of the spin dynamics of sodium-doped, type II NaxSi136 silicon clathrate films is reported. Focusing on the hyperfine lines of isolated Na atoms, the temperature dependence of the electron spin dynamics is examined from 6 to 25 K. The measurements exhibit multi-exponential decay, indicating multiple spin relaxation rates in the system. As expected, spin relaxation time (T1) increases rapidly with decreasing temperature, reaching ∼300 μs at 6.4 K. The phase memory (TM) shows less temperature dependence with a value of ∼3 μs at the same temperature. The temperature dependence of T1 exhibits Arrhenius behavior in the measurement range consistent with an Orbach pathway. There are strong similarities to the spin behavior of other defect donors in diamond silicon. The results provide insights into the potential of Si clathrates for spin-based applications.","PeriodicalId":8094,"journal":{"name":"Applied Physics Letters","volume":null,"pages":null},"PeriodicalIF":3.5000,"publicationDate":"2024-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Physics Letters","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1063/5.0230407","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0
Abstract
Type II Si clathrate is a Si-based, crystalline alternative to diamond silicon with interesting optoelectronic properties. Here, a pulsed electron paramagnetic resonance study of the spin dynamics of sodium-doped, type II NaxSi136 silicon clathrate films is reported. Focusing on the hyperfine lines of isolated Na atoms, the temperature dependence of the electron spin dynamics is examined from 6 to 25 K. The measurements exhibit multi-exponential decay, indicating multiple spin relaxation rates in the system. As expected, spin relaxation time (T1) increases rapidly with decreasing temperature, reaching ∼300 μs at 6.4 K. The phase memory (TM) shows less temperature dependence with a value of ∼3 μs at the same temperature. The temperature dependence of T1 exhibits Arrhenius behavior in the measurement range consistent with an Orbach pathway. There are strong similarities to the spin behavior of other defect donors in diamond silicon. The results provide insights into the potential of Si clathrates for spin-based applications.
期刊介绍:
Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology.
In addition to regular articles, the journal also publishes invited Fast Track, Perspectives, and in-depth Editorials which report on cutting-edge areas in applied physics.
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