{"title":"Errata to “A Spherical Coil Array for the Calibration of Whole-Head Magnetoencephalograph Systems”","authors":"Yoshiaki Adachi;Daisuke Oyama;Masanori Higuchi;Gen Uehara","doi":"10.1109/TIM.2024.3475788","DOIUrl":null,"url":null,"abstract":"In the above article [1], there is an error in (9). The correct equation is as below: \\begin{equation*} \\hat {\\sigma }^{2}=\\frac {\\sum _{j=1}^{16} \\Delta V_{j}^{2}}{16-6} =\\frac {\\sum _{j=1}^{16}\\left ({{V_{\\mathrm {cal}, j}-V_{\\mathrm {meas}, j}}}\\right )^{2}}{10}.\\end{equation*} The above error resulted in the calculated values for uncertainty displayed in Fig. 5 and Table III being smaller by 18%. The figure and table reflecting the correct values are as follows:TABLE IIISensor Parameters With Uncertainties channelx(mm)y(mm)z(mm) $n_x$ $n_y$ $n_z$ g(nT/V)CH240.39±0.5820.72±0.56163.84±0.410.1028±0.00840.1757±0.00810.9791±0.00171.176±0.011CH28116.76±0.22-14.51±0.293.61±0.230.9929±0.0008-0.1178±0.00690.0157±0.00691.135±0.008CH55-10.63±0.32116.38±0.2122.02±0.440.0262±0.00780.9993±0.0003-0.0254±0.00031.065±0.008CH115-135.52±0.577.07±0.6278.59±0.60-0.2907±0.00280.3784±0.00960.8788±0.00271.137±0.016CH140-19.74±0.42-116.89±0.3226.20±0.56-0.0926±0.0094-0.9951±0.00110.0352±0.00141.038±0.009The values following the plus-minus signs (±) correspond to uncertainties with a coverage factor $k=1$ . Fig. 5.Fig. 5.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"73 ","pages":"1-1"},"PeriodicalIF":5.6000,"publicationDate":"2024-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10750891","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10750891/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In the above article [1], there is an error in (9). The correct equation is as below: \begin{equation*} \hat {\sigma }^{2}=\frac {\sum _{j=1}^{16} \Delta V_{j}^{2}}{16-6} =\frac {\sum _{j=1}^{16}\left ({{V_{\mathrm {cal}, j}-V_{\mathrm {meas}, j}}}\right )^{2}}{10}.\end{equation*} The above error resulted in the calculated values for uncertainty displayed in Fig. 5 and Table III being smaller by 18%. The figure and table reflecting the correct values are as follows:TABLE IIISensor Parameters With Uncertainties channelx(mm)y(mm)z(mm) $n_x$ $n_y$ $n_z$ g(nT/V)CH240.39±0.5820.72±0.56163.84±0.410.1028±0.00840.1757±0.00810.9791±0.00171.176±0.011CH28116.76±0.22-14.51±0.293.61±0.230.9929±0.0008-0.1178±0.00690.0157±0.00691.135±0.008CH55-10.63±0.32116.38±0.2122.02±0.440.0262±0.00780.9993±0.0003-0.0254±0.00031.065±0.008CH115-135.52±0.577.07±0.6278.59±0.60-0.2907±0.00280.3784±0.00960.8788±0.00271.137±0.016CH140-19.74±0.42-116.89±0.3226.20±0.56-0.0926±0.0094-0.9951±0.00110.0352±0.00141.038±0.009The values following the plus-minus signs (±) correspond to uncertainties with a coverage factor $k=1$ . Fig. 5.Fig. 5.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.