Andrea Stevanato;Matteo Zini;Alessandro Biondi;Bruno Morelli;Alessandro Biasci
{"title":"Learning Memory-Contention Timing Models With Automated Platform Profiling","authors":"Andrea Stevanato;Matteo Zini;Alessandro Biondi;Bruno Morelli;Alessandro Biasci","doi":"10.1109/TCAD.2024.3449237","DOIUrl":null,"url":null,"abstract":"Commercial off-the-shelf (COTS) multicore platforms are often used to enable the execution of mixed-criticality real-time applications. In these systems, the memory subsystem is one of the most notable sources of interference and unpredictability, with the memory controller (MC) being a key component orchestrating the data flow between processing units and main memory. The worst-case response times of real-time tasks is indeed particularly affected by memory contention and, in turn, by the MC behavior as well. This article presents FrATM2, a Framework to Automatically learn the Timing Models of the Memory subsystem. The framework automatically generates and executes micro-benchmarks on bare-metal hardware to profile the platform behavior in a large number of memory-contention scenarios. After aggregating and filtering the collected measurements, FrATM2 trains MC models to bound memory-related interference. The MC models can be used to enable response-time analysis. The framework was evaluated on an AMD/Xilinx Ultrascale+ SoC, collecting gigabytes of raw experimental data by testing tents of thousands of contention scenarios.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 11","pages":"3816-3827"},"PeriodicalIF":2.7000,"publicationDate":"2024-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10745862/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Commercial off-the-shelf (COTS) multicore platforms are often used to enable the execution of mixed-criticality real-time applications. In these systems, the memory subsystem is one of the most notable sources of interference and unpredictability, with the memory controller (MC) being a key component orchestrating the data flow between processing units and main memory. The worst-case response times of real-time tasks is indeed particularly affected by memory contention and, in turn, by the MC behavior as well. This article presents FrATM2, a Framework to Automatically learn the Timing Models of the Memory subsystem. The framework automatically generates and executes micro-benchmarks on bare-metal hardware to profile the platform behavior in a large number of memory-contention scenarios. After aggregating and filtering the collected measurements, FrATM2 trains MC models to bound memory-related interference. The MC models can be used to enable response-time analysis. The framework was evaluated on an AMD/Xilinx Ultrascale+ SoC, collecting gigabytes of raw experimental data by testing tents of thousands of contention scenarios.
期刊介绍:
The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.