{"title":"TPE-Det: A Tamper-Proof External Detector via Hardware Traces Analysis Against IoT Malware","authors":"Ziming Zhao;Zhaoxuan Li;Tingting Li;Fan Zhang","doi":"10.1109/TCAD.2024.3444712","DOIUrl":null,"url":null,"abstract":"With the widespread use of Internet of Things (IoT) devices, malware detection has become a hot spot for both academic and industrial communities. A series of solutions based on system calls, system logs, or hardware performance counters achieve promising results. However, such internal monitors are easily tampered with, especially against adaptive adversaries. In addition, existing system log records typically exhibit substantial volume, resulting in data explosion problems. In this article, we present TPE-Det, a side-channel-based external monitor to cope with these issues. Specifically, TPE-Det leverages the serial peripheral interface bus to extract the on-chip traces and designs a recovery pipeline for operating logs. The advantages of this external monitor are adversary-unperceived and tamper-proof. The restored logs mainly include file operation commands, which are lightweight compared to complete records. Meanwhile, we deploy a series of machine learning models with respect to statistical, sequence, and graph features to identify malware. Empirical evaluation shows that our proposal has tamper-proof capability, high-detection accuracy, and low-time/space overhead compared to state-of-the-art methods.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 11","pages":"3455-3466"},"PeriodicalIF":2.7000,"publicationDate":"2024-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10745786/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
With the widespread use of Internet of Things (IoT) devices, malware detection has become a hot spot for both academic and industrial communities. A series of solutions based on system calls, system logs, or hardware performance counters achieve promising results. However, such internal monitors are easily tampered with, especially against adaptive adversaries. In addition, existing system log records typically exhibit substantial volume, resulting in data explosion problems. In this article, we present TPE-Det, a side-channel-based external monitor to cope with these issues. Specifically, TPE-Det leverages the serial peripheral interface bus to extract the on-chip traces and designs a recovery pipeline for operating logs. The advantages of this external monitor are adversary-unperceived and tamper-proof. The restored logs mainly include file operation commands, which are lightweight compared to complete records. Meanwhile, we deploy a series of machine learning models with respect to statistical, sequence, and graph features to identify malware. Empirical evaluation shows that our proposal has tamper-proof capability, high-detection accuracy, and low-time/space overhead compared to state-of-the-art methods.
期刊介绍:
The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.