{"title":"Flexible Dual Flower-Shaped FSS for Conformal Applications With Low Aberration of Far-Field Pattern","authors":"Zhaoran Chen;Peiwen Zhang;Junjie Hu;Xiayuan Yao","doi":"10.1109/TEMC.2024.3485050","DOIUrl":null,"url":null,"abstract":"In this article, a novel conformal frequency selective surface (FSS) with dual reflection bands located at X and Ku bands and a transmission window near 12 GHz is proposed, which brings little aberration in the far-field pattern. The unit cell consists of double flower-shaped strips on an ultrathin dielectric slab. The equivalent circuit model is established by the field distributions to illustrate the resonant mechanism, the parameters of which are calculated. The planar and elliptic cylindrical samples are fabricated and tested. The test results are consistent with simulation data. The two samples’ averages of shielding effectiveness are no less than 16 dB. The insertion losses of the planar and the curved FSS are less than 1 dB in the passband. The near-field distributions in three concerned bands are scanned. The conformal FSS excites slight distortion in the passband but stirs the distributions into a mess, the electric field intensity of which drops by 20 dB in the stopbands. Moreover, the absolute gains in the passband are tested in compact antenna test range. The far-field pattern is also evaluated by near-field to far-field method. The data obtained by two methods is consistent with the simulation. Little aberration by the FSS occurs in the passband, and the average gain's deviation is no more than 0.64 dB.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"1744-1758"},"PeriodicalIF":2.0000,"publicationDate":"2024-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10745122/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this article, a novel conformal frequency selective surface (FSS) with dual reflection bands located at X and Ku bands and a transmission window near 12 GHz is proposed, which brings little aberration in the far-field pattern. The unit cell consists of double flower-shaped strips on an ultrathin dielectric slab. The equivalent circuit model is established by the field distributions to illustrate the resonant mechanism, the parameters of which are calculated. The planar and elliptic cylindrical samples are fabricated and tested. The test results are consistent with simulation data. The two samples’ averages of shielding effectiveness are no less than 16 dB. The insertion losses of the planar and the curved FSS are less than 1 dB in the passband. The near-field distributions in three concerned bands are scanned. The conformal FSS excites slight distortion in the passband but stirs the distributions into a mess, the electric field intensity of which drops by 20 dB in the stopbands. Moreover, the absolute gains in the passband are tested in compact antenna test range. The far-field pattern is also evaluated by near-field to far-field method. The data obtained by two methods is consistent with the simulation. Little aberration by the FSS occurs in the passband, and the average gain's deviation is no more than 0.64 dB.
期刊介绍:
IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.