{"title":"Forward and backward emission of secondary ions from biomolecules on single-layer graphene by MeV Cn+ (n = 1–6) impacts","authors":"Naruki Uno , Takuya Majima , Manabu Saito , Kaoru Nakajima , Hidetsugu Tsuchida","doi":"10.1016/j.nimb.2024.165548","DOIUrl":null,"url":null,"abstract":"<div><div>We studied the emission of secondary ions using a cluster ion with MeV energy in transmission secondary ion mass spectrometry. The primary ions used were 0.6 MeV/atom C<em><sub>n</sub></em><sup>+</sup>, where <em>n</em> ranges from 1 to 6. Single-layer graphene was used as a support membrane for depositing a biomolecular target of phenylalanine. Positive secondary ions emitted in both forward and backward directions were measured separately. We found that the yield of forward-emitted secondary ions was higher than that of backward-emitted secondary ions. Our results showed that the yield of secondary ions emitted in both directions increased as the size of incident cluster ions increased. This increase was non-linear and can be attributed to the track overlap effect of incident cluster ions. We also found a scaling parameter consistently describing the incident cluster size dependence of the forward and backward-emitted secondary ion yields.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"557 ","pages":"Article 165548"},"PeriodicalIF":1.4000,"publicationDate":"2024-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0168583X24003185","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
We studied the emission of secondary ions using a cluster ion with MeV energy in transmission secondary ion mass spectrometry. The primary ions used were 0.6 MeV/atom Cn+, where n ranges from 1 to 6. Single-layer graphene was used as a support membrane for depositing a biomolecular target of phenylalanine. Positive secondary ions emitted in both forward and backward directions were measured separately. We found that the yield of forward-emitted secondary ions was higher than that of backward-emitted secondary ions. Our results showed that the yield of secondary ions emitted in both directions increased as the size of incident cluster ions increased. This increase was non-linear and can be attributed to the track overlap effect of incident cluster ions. We also found a scaling parameter consistently describing the incident cluster size dependence of the forward and backward-emitted secondary ion yields.
期刊介绍:
Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.