Reflectivity test method of x-ray optics at the 100-m x-ray test facility

IF 2.7 3区 物理与天体物理 Q2 ASTRONOMY & ASTROPHYSICS
Yuxuan Zhu, Zijian Zhao, Dongjie Hou, Yanji Yang, Xiongtao Yang, Yifan Zhang, Kaiji Wu, Fei Ding, Dong Xie, Yupeng Xu, Bo Wang, Langping Wang, Yusa Wang
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引用次数: 0

Abstract

Reflectivity is a key topic in soft X-ray optics research and serves as the foundation for studying the performance of the optics for X-ray astronomical satellites. Since its establishment, the 100-m X-ray Test Facility (100XF) has been continuously developing various testing functionalities, including calibration of timing, imaging, and energy response. This paper provides a detailed description of the X-ray optics reflectivity test method based on the 100XF, which can be applied to various grazing incident X-ray optics, including Wolter-I and lobster-eye types, significantly expanding the application scope of the 100XF. A flat mirror sample (SiO\(_{\text{2 }}\) coated on a Si wafer) is tested. Results of the variation of reflectivity with angle @ C-K\(\alpha \) (0.28 keV), Al-K\(\alpha \)(1.49 keV), and Ti-K\(\alpha \)(4.50 keV) are presented in the description. The reflectivity test method has also been applied to the coating reflectivity study of the enhanced X-ray Timing and Polarimetry Mission (eXTP) mirror. At the same time, a new method utilizing the continuum spectrum of bremsstrahlung was carried out to study the continuous variation of reflectivity with energy, greatly improving efficiency compared to traditional methods, and all the results show a good agreement with the theoretical values. The deviation between the test and theoretical values in the low-energy range (1.5-8.0 keV) is less than 10%.

100 米 X 射线测试设备的 X 射线光学器件反射率测试方法
反射率是软 X 射线光学研究的关键课题,也是研究 X 射线天文卫星光学性能的基础。自建立以来,100 米 X 射线测试设备(100XF)一直在不断开发各种测试功能,包括定时校准、成像和能量响应。本文详细介绍了基于 100XF 的 X 射线光学器件反射率测试方法,该方法可应用于各种掠入射 X 射线光学器件,包括 Wolter-I 和龙虾眼类型,大大扩展了 100XF 的应用范围。测试了一个平面镜样品(在硅晶片上镀有 SiO\(_{\text{2 }}/)。描述中给出了反射率随角度变化的结果@ C-K\(α \) (0.28 keV)、Al-K/(α \) (1.49 keV)和Ti-K/(α \) (4.50 keV)。该反射率测试方法还被应用于增强型 X 射线定时和偏振探测任务(eXTP)反射镜的涂层反射率研究。同时,利用轫致辐射连续谱的新方法研究了反射率随能量的连续变化,与传统方法相比大大提高了效率,所有结果均与理论值吻合。在低能量范围(1.5-8.0 keV)内,测试值与理论值的偏差小于 10%。
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来源期刊
Experimental Astronomy
Experimental Astronomy 地学天文-天文与天体物理
CiteScore
5.30
自引率
3.30%
发文量
57
审稿时长
6-12 weeks
期刊介绍: Many new instruments for observing astronomical objects at a variety of wavelengths have been and are continually being developed. Furthermore, a vast amount of effort is being put into the development of new techniques for data analysis in order to cope with great streams of data collected by these instruments. Experimental Astronomy acts as a medium for the publication of papers of contemporary scientific interest on astrophysical instrumentation and methods necessary for the conduct of astronomy at all wavelength fields. Experimental Astronomy publishes full-length articles, research letters and reviews on developments in detection techniques, instruments, and data analysis and image processing techniques. Occasional special issues are published, giving an in-depth presentation of the instrumentation and/or analysis connected with specific projects, such as satellite experiments or ground-based telescopes, or of specialized techniques.
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