Evaluation and calibration of matrix effects during SIMS silicon isotope analysis in silicate glasses†

IF 3.1 2区 化学 Q2 CHEMISTRY, ANALYTICAL
Liu-Yang Chen, Yu Liu, Di Zhang, Guo-Qiang Tang and Qiu-Li Li
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引用次数: 0

Abstract

Silicon is one of the most abundant elements in rocks, and its isotopic composition can be traced back to various geological processes. In situ high-precision silicon isotope analysis requires matrix-matched standards as reference materials for mass fractionation calibration. However, finding completely matrix-matched standards is impractical for minerals or glasses with complex matrices or a wide range of chemical compositions. For instance, the major component variation in lunar glasses can reach 30%, making it impossible to find matrix-matched standards for each glass bead. In this study, SIMS silicon isotope analyses on eleven glass standards ranging from basaltic to rhyolitic compositions were conducted to evaluate the relationship between instrumental mass fractionation and the major components. We established a calibration model highly correlated with instrumental mass fractionation based on the contents of Si, Ca, Al and Mg (R2 = 0.997, SCAM model) in glass samples. This model can accurately calibrate the instrumental mass fractionation of silicon isotopes in glass samples within the compositional range covered by the standards, providing insights and methods for accurately determining various isotope compositions in glass samples with varying compositions.

Abstract Image

评估和校准硅酸盐玻璃中 SIMS 硅同位素分析过程中的基体效应†。
硅是岩石中含量最高的元素之一,其同位素组成可追溯到各种地质过程。原位高精度硅同位素分析需要基质匹配的标准物质作为质量分馏校准的参考材料。然而,对于基质复杂或化学成分范围广泛的矿物或玻璃来说,找到完全匹配的基质标准是不切实际的。例如,月球玻璃中主要成分的变化可达 30%,因此不可能为每颗玻璃珠找到基质匹配的标准物质。在这项研究中,我们对从玄武岩到流纹岩成分的 11 种玻璃标准物质进行了 SIMS 硅同位素分析,以评估仪器质量分馏与主要成分之间的关系。根据玻璃样品中硅、钙、铝和镁的含量,我们建立了一个与仪器质量分馏高度相关的校准模型(R2 = 0.997,SCAM 模型)。该模型可在标准涵盖的成分范围内准确校准玻璃样品中硅同位素的仪器质量分馏,为准确测定不同成分玻璃样品中的各种同位素成分提供了见解和方法。
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来源期刊
CiteScore
6.20
自引率
26.50%
发文量
228
审稿时长
1.7 months
期刊介绍: Innovative research on the fundamental theory and application of spectrometric techniques.
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