Design of pattern image generation technique based on self-attentive residual conditional generative adversarial network

Abstract

Image generation techniques have made remarkable progress in the digital image processing and computer vision. However, traditional generation models cannot meet the complexity and diversity requirements of patterned images. In view of this, the study aims to enhance the quality of generated pattern images, which uses improved residual block, and introduces a self-attention mechanism to compute the weight parameters of the input features to enhance the accuracy. Comparing with three image generation models, the research model shows lower Frechette initial distance, which is better than the other three methods, and the average Frechette initial distance values in the four scenes are 175.23, 176.41, 174.41, and 165.23. Generated mouths and eyes: the average values of Frechette initial distances reach 98.23 and 97.24, respectively. For emotion classification, the Frechette initial distance averages for sad, excited, and calm emotions were 82.34, 75.63, and 70.21, respectively. The model was trained up to 2500 iterations, and the loss value was reduced to 0.54, with an accuracy of 98.23%, confirming its effectiveness and high performance. The self attention residual network enhances the model's ability to capture image details, effectively improving the quality and accuracy of image generation, and providing a new technological path for radiation imaging data processing and analysis in radiation science.