Yuanfeng Xie, Hanqing Luo, Liping Liang, Junhong Gan
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引用次数: 0
Abstract
Physical Unclonable Function (PUF) circuits, as a lightweight hardware security primitive, can provide reliable authentication for resource-constrained Internet of Things (IoT) devices. However, in real-time environments and systems, authentication of embedded devices has strict requirements on resources and low latency. Therefore, this paper proposes a lightweight dual-link accelerated authentication protocol design based on NLFSR-XOR APUF, through the study of Non-Linear Feedback Shift Registers (NLFSR) and XOR APUF circuits. First, the scheme utilizes the symmetric path delay deviation characteristics of APUF and the complexity of NLFSR state transitions to form a nonlinear output function that changes with the challenge signal. Then, a lightweight and attack-resistant authentication protocol is established by combining the random probability of shuffling array bits with the XOR confusion mechanism. Finally, the advantages of GPU parallel computing and AES T-table reconfiguration scheme are used to achieve an accelerated and side-channel attack-resistant authentication protocol. Experimental results show that the PUF circuit can effectively resist various modeling attacks, including logistic regression (LR), artificial neural network (ANN), and support vector machine (SVM). The security of the protocol has been formally verified, and the prototype has been implemented on the Xilinx xc100T development board, effectively resisting deception attacks, physical attacks, and modeling attacks. The protocol's area overhead in terms of LUT and encryption time is reduced by 58.6 % and 67.8 %, respectively, compared to similar protocols.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.