Above-threshold ionization with X-ray free-electron lasers

Abstract

This study delves into the relatively uncharted territory of Above Threshold Ionization in atoms, triggered by intense X-ray radiation fields. At these frequencies, the energy of a single photon far exceeds the ionization potential of valence electrons in atoms and molecules. The conditions we examine are similar to those achievable with current or future free-electron laser facilities. Under such high-energy scenarios, the onset of strong field ionization requires a shift away from the traditional quasi-classical approach. Here, we present an analytical model to characterize how the field-free ionization potential, ponderomotive energy, and photon energy govern the transition to this regime, all accounted for by means of the Keldysh and Reiss parameters. We show that both of these parameters are needed to capture the onset of strong-field behavior due to both bound state and continuum state properties. At higher X-ray intensities, we find that ionization rates deviate from the linear intensity scaling expected from lowest order perturbative processes, corresponding to channel closure and higher-order photon absorption processes. This study explores Above Threshold Ionization in atoms induced by intense X-ray radiation fields, where photon energy surpasses the ionization potential of valence electrons. The authors demonstrate that both the Keldysh and Reiss parameters are essential to capture the onset of strong-field behavior, revealing deviations from weak-field intensity scaling at higher X-ray intensities.