Hybrid TLM-CTLM Test Structure for Determining Specific Contact Resistivity of Ohmic Contacts

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Pan Yue, Thanh Pham Chi, Anthony Holland
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引用次数: 0

Abstract

Various test structures can be used to determine the specific contact resistivity of ohmic contacts. The transmission line model test structure and circular transmission line model test structure are the most commonly used. The analytical expressions of the former are straightforward and effectively describe the electrical behaviour of a contact, while the concentric geometry of the latter eliminates complications during fabrication. In this article, we present a hybrid test structure that combines the advantages of the transmission line and the circular transmission line models. The analytical expressions of the new structure are presented, and its finite-element modelling is undertaken. The effect of contact geometry on this test structure is also discussed. Using the presented test structure, determining contact parameters does not require any error corrections.

用于测定欧姆触点比接触电阻率的混合 TLM-CTLM 测试结构
有多种测试结构可用于确定欧姆触点的比接触电阻率。最常用的是传输线模型试验结构和圆形传输线模型试验结构。前者的分析表达式简单明了,能有效描述触点的电气特性,而后者的同心几何结构则消除了制造过程中的复杂性。在本文中,我们提出了一种混合测试结构,它结合了传输线模型和环形传输线模型的优点。文章给出了新结构的分析表达式,并对其进行了有限元建模。此外,还讨论了接触几何形状对该测试结构的影响。使用所介绍的测试结构,确定接触参数不需要任何误差修正。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
4.60
自引率
6.20%
发文量
101
审稿时长
>12 weeks
期刊介绍: Prediction through modelling forms the basis of engineering design. The computational power at the fingertips of the professional engineer is increasing enormously and techniques for computer simulation are changing rapidly. Engineers need models which relate to their design area and which are adaptable to new design concepts. They also need efficient and friendly ways of presenting, viewing and transmitting the data associated with their models. The International Journal of Numerical Modelling: Electronic Networks, Devices and Fields provides a communication vehicle for numerical modelling methods and data preparation methods associated with electrical and electronic circuits and fields. It concentrates on numerical modelling rather than abstract numerical mathematics. Contributions on numerical modelling will cover the entire subject of electrical and electronic engineering. They will range from electrical distribution networks to integrated circuits on VLSI design, and from static electric and magnetic fields through microwaves to optical design. They will also include the use of electrical networks as a modelling medium.
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