Analysis of etched drain based Cylindrical agate-all-around tunnel field effect transistor based static random access memory cell design

Abstract

This paper aims to propose a novel method for designing an static random access memory (SRAM) cell using an etched drain based Cyl GAA TFET with a hetero-substrate material and an elevated density strip. The aim is to reduce power dissipation and improve stability, as demonstrated through analysis utilizing static noise margin (SNM) as well as N-curve methods. With respect to the 16 nm MOSFET based SRAM cell, the proposed device-based SRAM cell shows significant improvements with a 68.305% reduction in leakage power, a 15.58% increase in static voltage noise margin (SVNM), an 8.623% increase in static current noise margin (SINM), an 8.152% increase in write trip voltage (WTV), a 12.86% increase in write trip current (WTI), a 27.62% increase in static power noise margin (SPNM), and a 19.95% increase in write trip power (WTP). The design is implemented and analyzed using Cadence Virtuoso software, and a novel approach of look up tables and Verilog A is utilized for the device to circuit application. These results indicate promising advancements in the design of SRAM cells, which could have significant implications for the development of advanced computer systems.