Decoupling for microstrip antenna array based on characteristic mode analysis

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Wei Si, Guodong Han, Yakun Liu
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引用次数: 0

Abstract

A new decoupling method for microstrip antenna arrays has been proposed in this paper, which is based on characteristic mode analysis. This method works by suppressing the nonworking mode that contributes the most to mutual coupling. An eight-element microstrip antenna array is designed as the reference antenna, and for this antenna, mode suppression is achieved by etching gaps on the patch and adding metal columns between the patch and the ground. The antenna array after the mode suppression is fabricated and measured. The results show that the measured S34 after the mode suppression is below −21 dB, whereas the simulated S34 of the reference antenna array is about −15 dB. This indicated a 7–10.5 dB reduction in coupling across the band. Additionally, the measured ActiveS3 after the mode suppression is still below −11 dB. Besides, the measured and simulated normalized array patterns after the mode suppression agree well at different frequencies.

基于特征模态分析的微带天线阵列去耦
本文提出了一种新的微带天线阵列去耦方法,该方法基于特征模分析。这种方法通过抑制对相互耦合影响最大的非工作模式来实现。本文设计了一个八元件微带天线阵列作为参考天线,通过在贴片上蚀刻间隙以及在贴片和地面之间添加金属柱来实现模式抑制。制作并测量了模式抑制后的天线阵列。结果显示,模式抑制后的测量 S34 低于 -21 dB,而参考天线阵列的模拟 S34 约为 -15 dB。这表明整个频带的耦合降低了 7-10.5 dB。此外,模式抑制后测量的 ActiveS3 仍然低于 -11 dB。此外,模式抑制后测量和模拟的归一化阵列图案在不同频率下也非常吻合。
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来源期刊
Microwave and Optical Technology Letters
Microwave and Optical Technology Letters 工程技术-工程:电子与电气
CiteScore
3.40
自引率
20.00%
发文量
371
审稿时长
4.3 months
期刊介绍: Microwave and Optical Technology Letters provides quick publication (3 to 6 month turnaround) of the most recent findings and achievements in high frequency technology, from RF to optical spectrum. The journal publishes original short papers and letters on theoretical, applied, and system results in the following areas. - RF, Microwave, and Millimeter Waves - Antennas and Propagation - Submillimeter-Wave and Infrared Technology - Optical Engineering All papers are subject to peer review before publication
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