XRD Peak Profile and Inverse Pole Figure Analysis of Ceria (CeO2) Nanoparticles

Abstract

The pursuit of identifying and enhancing a preferred grain texture has emerged as a viable approach to improve functional properties. X-ray and neutron diffraction techniques have proven to be invaluable tools for probing crystallographic textures. In this study, ceria (CeO2) nanoparticles were synthesized via the precipitation method, and their structural and morphological characteristics were investigated through X-ray diffraction (XRD) and field emission scanning electron microscopy (FESEM) analyses. The inconsistent behavior in the long-range two theta values of CeO₂ is elucidated from the crystallite size and strain plot. Hence, the XRD peak profile of the CeO₂ nanoparticles can be assessed through the Williamson – Hall (W-H), size strain plot (SSP), and Halder – Wagner (H-W) method. Among these, The Halder – Wagner method gives better structural parameter values and it confirms the existence of compressive strain in the CeO₂ lattice. Plane orientation, distribution, and position of Ce and O₂ atoms in the CeO₂ lattice are confirmed from the Rietveld refinement and texture analysis using GSAS – II. The regions of highest pole densities coincide with the (111) positions from the standard stereographic projection (001) which confirms the majority of particles in CeO₂ nanoparticles are aligned along the (001) plane.