{"title":"Processing and development of ferroelectric Bi(Fe2/3V1/3)O3-based electronic material for temperature sensor","authors":"Arun Kumar Das, Ashis Tripathy, Satyanarayan Bhuyan, Ashok Mondal, Arya Tripathy","doi":"10.1007/s10854-024-13759-y","DOIUrl":null,"url":null,"abstract":"<div><p>As temperature sensors, ferroelectric materials offer a wide range of fascinating applications. However, toxicity, hysteresis, low sensitivity, delayed response times, and recovery times are some of the inevitable drawbacks that prevent their use in a number of exciting and novel applications. The current study investigates a lead-free mixed oxide [Bi(Fe<sub>2/3</sub>V<sub>1/3</sub>)O<sub>3</sub>: BFV] ferroelectric nanocomposite-based capacitive component which is supported by the studied dielectric, impedance, capacitive, and pyro-electric characteristics. It is a potential candidate for designing and developing a capacitive-type temperature sensor. In comparison to a standard capacitive temperature sensor, the fabricated BFV-nanocomposite-based sensor exhibits a reversible response with no noticeable fluctuation, good linearity (R<sup>2</sup> = 0.98), a quick response time (3.24 s), a recovery time (5.29 s), exceptional repeatability over several cycles, and a reasonably high sensitivity (639 fF/°C). For thirty days, long-term stability was ensured by monitoring the sensor’s response. The developed BFV nanocomposite sensor’s superior sensing response makes it a viable option for use in cutting-edge advanced electronics and industrial applications.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-10-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-024-13759-y","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
As temperature sensors, ferroelectric materials offer a wide range of fascinating applications. However, toxicity, hysteresis, low sensitivity, delayed response times, and recovery times are some of the inevitable drawbacks that prevent their use in a number of exciting and novel applications. The current study investigates a lead-free mixed oxide [Bi(Fe2/3V1/3)O3: BFV] ferroelectric nanocomposite-based capacitive component which is supported by the studied dielectric, impedance, capacitive, and pyro-electric characteristics. It is a potential candidate for designing and developing a capacitive-type temperature sensor. In comparison to a standard capacitive temperature sensor, the fabricated BFV-nanocomposite-based sensor exhibits a reversible response with no noticeable fluctuation, good linearity (R2 = 0.98), a quick response time (3.24 s), a recovery time (5.29 s), exceptional repeatability over several cycles, and a reasonably high sensitivity (639 fF/°C). For thirty days, long-term stability was ensured by monitoring the sensor’s response. The developed BFV nanocomposite sensor’s superior sensing response makes it a viable option for use in cutting-edge advanced electronics and industrial applications.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.