Identifying the Optical Fiber Based on the Compact OFDR System via Reflecting Estimation

Abstract

This article reports an effective, robust, and universal estimating method to enhance and maintain the measuring accuracy for the semiconductor laser (SCL)-based optical frequency-domain reflectometry (OFDR) by estimating the reflecting locations. The core is to build the bridge between the limited data sampling rate and almost continued real values, providing the potential strategy for high-resolution fiber sensing without the modulated optical fibers. The experiments demonstrate that the described method can be effectively applied to a range of applicating areas, resulting in the millimeter-level optical fiber subset identifying with an error equal rate (EER) of less than 1%.