Rajat Syal, Priyanka Sharma, Rahul Goel, Arun Kumar Singh, O. P. Thakur, K. K. Sharma, Sanjeev Kumar
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引用次数: 0
Abstract
We perform systematic investigation on (1-x)Ba(Zr0.20Ti0.80)O3-x(Ba0.70Ca0.30)TiO3 ceramics prepared by solid state reaction technique. We thoroughly investigate the effect of synthesis procedure on crystal structure, microstructure, dielectric, ferroelectric, and piezoelectric properties. Room temperature X-Ray diffraction (XRD) patterns reveal that the as synthesized samples crystallize with desired perovskite phase. Scanning electron microscopy depicts that the grain size shows significant enhancement in size. Large grains having size ~ 36 μm were observed in 50(BZT-BCT) composition prepared using modified synthesis route. Dielectric analysis depicts that the Curie temperature ‘Tc’ and diffusive coefficient ‘γ’ are considerably affected by the synthesis process. Ferroelectric studies show the well saturated loops at 30 kV/cm, and observed maximum values of remnant polarization (Pr), saturation polarization (Ps) and low values of coercive field (Ec) ~ 12.39 μC/cm2, 22.67 μC/cm2 and 3.05 kV/cm, respectively for 50(BZT-BCT) composition. Excellent piezoelectric properties (d33 ~ 520 pC/N and kp ~ 57.5%) were observed in 50(BZT-BCT) ceramic. The present manuscript highlights the various parameters affected the synthesis process. The results show that the modified synthesis route enhanced the properties of the ceramic and are promising candidates for lead-free piezoelectric applications.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.