Chao Chen, Han Luo, Jianwei Gan, Ya Kong, Bingxue Yi, Xinyu Chen, Zhaonan Li
{"title":"Ray-tracing-based three-dimensional profilometry using fringe projection","authors":"Chao Chen, Han Luo, Jianwei Gan, Ya Kong, Bingxue Yi, Xinyu Chen, Zhaonan Li","doi":"10.1007/s00340-024-08333-7","DOIUrl":null,"url":null,"abstract":"<div><p>A fringe projection system, in special application scenarios, is used for three-dimensional (3D) shape measurement through a transparent medium. The light refraction caused by the medium gives rise to erroneous 3D data in conventional fringe projection methods. In this work, we propose ray-tracing-based 3D profilometry using fringe projection. The method uses phase information for seeking the homologous points between camera images and projector images pixel by pixel. Equations of light rays emitted from each point pair are identified with the law of flat refraction. A midpoint of skew lines common perpendicular algorithm is developed for calculating the intersections of these equations, which are 3D shape data without refraction error. For validation, a fringe projection system through a transparent glass was set up and applied for 3D shape measurements. The results verify the effectiveness and accuracy of the proposed ray-tracing-based 3D profilometry.</p></div>","PeriodicalId":474,"journal":{"name":"Applied Physics B","volume":null,"pages":null},"PeriodicalIF":2.0000,"publicationDate":"2024-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Physics B","FirstCategoryId":"4","ListUrlMain":"https://link.springer.com/article/10.1007/s00340-024-08333-7","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0
Abstract
A fringe projection system, in special application scenarios, is used for three-dimensional (3D) shape measurement through a transparent medium. The light refraction caused by the medium gives rise to erroneous 3D data in conventional fringe projection methods. In this work, we propose ray-tracing-based 3D profilometry using fringe projection. The method uses phase information for seeking the homologous points between camera images and projector images pixel by pixel. Equations of light rays emitted from each point pair are identified with the law of flat refraction. A midpoint of skew lines common perpendicular algorithm is developed for calculating the intersections of these equations, which are 3D shape data without refraction error. For validation, a fringe projection system through a transparent glass was set up and applied for 3D shape measurements. The results verify the effectiveness and accuracy of the proposed ray-tracing-based 3D profilometry.
期刊介绍：
Features publication of experimental and theoretical investigations in applied physics
Offers invited reviews in addition to regular papers
Coverage includes laser physics, linear and nonlinear optics, ultrafast phenomena, photonic devices, optical and laser materials, quantum optics, laser spectroscopy of atoms, molecules and clusters, and more
94% of authors who answered a survey reported that they would definitely publish or probably publish in the journal again
Publishing essential research results in two of the most important areas of applied physics, both Applied Physics sections figure among the top most cited journals in this field.
In addition to regular papers Applied Physics B: Lasers and Optics features invited reviews. Fields of topical interest are covered by feature issues. The journal also includes a rapid communication section for the speedy publication of important and particularly interesting results.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
