Rapid Inspection System for Weak Feature Micro-Flaw on Large-Aperture Optics Surface Based on Multi-Illumination Modes and Multitask Learning Algorithms
IF 5.6 2区 工程技术Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
{"title":"Rapid Inspection System for Weak Feature Micro-Flaw on Large-Aperture Optics Surface Based on Multi-Illumination Modes and Multitask Learning Algorithms","authors":"Zhaoyang Yin;Linjie Zhao;Jian Cheng;Henan Liu;Mingjun Chen","doi":"10.1109/TIM.2024.3472831","DOIUrl":null,"url":null,"abstract":"The occurrence of surface damage and contaminants can shorten the service life of large-aperture optics in high-power laser facilities, and efficient and accurate inspection of these flaws is an integral part of facility maintenance. Achieving rapid inspection of micrometer-level flaws (\n<inline-formula> <tex-math>$\\gt 20~\\mu $ </tex-math></inline-formula>\nm) on large-aperture optics surface (\n<inline-formula> <tex-math>$430\\times 430$ </tex-math></inline-formula>\n mm) is a great challenge for both imaging systems and detection algorithms. To solve this problem, a rapid inspection system based on multi-illumination system and dark-field imaging principle is designed, which can complete full-aperture inspection of front and back surface of optics at one time through single-frame imaging and image processing. The application of multi-illumination modes increases the differentiation between different categories of weak feature flaws and provides sufficient information for flaw classification and measurement. A multitask deep learning (DL) framework that joints flaw classification and size regression is also designed to improve the classification capability and size measurement precision of the system for micro-flaws. The experimental results show that the system can perform a fast inspection of optics at a rate of less than 1.5 min per piece. The classification accuracy for four categories of flaws is 98.5% and the mean relative error (MRE) of size measurement is 14.8%. In the range of 20–\n<inline-formula> <tex-math>$150~\\mu $ </tex-math></inline-formula>\nm, exceeding the resolution limit of the imaging system, the detection system still maintains a high accuracy (98.9%) and low measurement error (15.6%). The proposed inspection system and the method for large-aperture optics achieve rapid detection of weak feature micro-flaws, which provides a highly promising solution for rapid, accurate, and low-cost inspection of precision optics.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"73 ","pages":"1-15"},"PeriodicalIF":5.6000,"publicationDate":"2024-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10719605/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The occurrence of surface damage and contaminants can shorten the service life of large-aperture optics in high-power laser facilities, and efficient and accurate inspection of these flaws is an integral part of facility maintenance. Achieving rapid inspection of micrometer-level flaws (
$\gt 20~\mu $
m) on large-aperture optics surface (
$430\times 430$
mm) is a great challenge for both imaging systems and detection algorithms. To solve this problem, a rapid inspection system based on multi-illumination system and dark-field imaging principle is designed, which can complete full-aperture inspection of front and back surface of optics at one time through single-frame imaging and image processing. The application of multi-illumination modes increases the differentiation between different categories of weak feature flaws and provides sufficient information for flaw classification and measurement. A multitask deep learning (DL) framework that joints flaw classification and size regression is also designed to improve the classification capability and size measurement precision of the system for micro-flaws. The experimental results show that the system can perform a fast inspection of optics at a rate of less than 1.5 min per piece. The classification accuracy for four categories of flaws is 98.5% and the mean relative error (MRE) of size measurement is 14.8%. In the range of 20–
$150~\mu $
m, exceeding the resolution limit of the imaging system, the detection system still maintains a high accuracy (98.9%) and low measurement error (15.6%). The proposed inspection system and the method for large-aperture optics achieve rapid detection of weak feature micro-flaws, which provides a highly promising solution for rapid, accurate, and low-cost inspection of precision optics.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.