{"title":"Enhancing charge-emitting shallow traps in metal halide perovskites by >100 times by surface strain","authors":"Ying Zhou, Hengkai Zhang, Yeming Xian, Zhifang Shi, Jean Noalick Aboa, Chengbin Fei, Guang Yang, Nengxu Li, Farida A. Selim, Yanfa Yan, Jinsong Huang","doi":"10.1016/j.joule.2024.10.004","DOIUrl":null,"url":null,"abstract":"The low density of deep trapping defects in metal halide perovskites (MHPs) is essential for high-performance optoelectronic devices. Shallow traps in MHPs are speculated to enhance charge recombination lifetime. However, chemical nature and distribution of these shallow traps as well as their impact on solar cell operation remain unknown. Herein, we report that shallow traps are much richer in MHPs than traditional semiconductors, and their density can be enhanced by >100 times through local surface strain, indicating that shallow traps are mainly located at the surface. The surface strain is introduced by anchoring two-amine-terminated molecules onto formamidinium cations, and the shallow traps are formed by the band edge downshifting toward defect levels. The high-density shallow traps temporarily hold one type of charge and increased the concentration of the other type of free carrier in working solar cells by keeping photogenerated charges from bimolecular recombination, resulting in a reduced open-circuit voltage loss to 317 mV.","PeriodicalId":343,"journal":{"name":"Joule","volume":"8 1","pages":""},"PeriodicalIF":38.6000,"publicationDate":"2024-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Joule","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1016/j.joule.2024.10.004","RegionNum":1,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0
Abstract
The low density of deep trapping defects in metal halide perovskites (MHPs) is essential for high-performance optoelectronic devices. Shallow traps in MHPs are speculated to enhance charge recombination lifetime. However, chemical nature and distribution of these shallow traps as well as their impact on solar cell operation remain unknown. Herein, we report that shallow traps are much richer in MHPs than traditional semiconductors, and their density can be enhanced by >100 times through local surface strain, indicating that shallow traps are mainly located at the surface. The surface strain is introduced by anchoring two-amine-terminated molecules onto formamidinium cations, and the shallow traps are formed by the band edge downshifting toward defect levels. The high-density shallow traps temporarily hold one type of charge and increased the concentration of the other type of free carrier in working solar cells by keeping photogenerated charges from bimolecular recombination, resulting in a reduced open-circuit voltage loss to 317 mV.
期刊介绍:
Joule is a sister journal to Cell that focuses on research, analysis, and ideas related to sustainable energy. It aims to address the global challenge of the need for more sustainable energy solutions. Joule is a forward-looking journal that bridges disciplines and scales of energy research. It connects researchers and analysts working on scientific, technical, economic, policy, and social challenges related to sustainable energy. The journal covers a wide range of energy research, from fundamental laboratory studies on energy conversion and storage to global-level analysis. Joule aims to highlight and amplify the implications, challenges, and opportunities of novel energy research for different groups in the field.