{"title":"Fault-tolerant routing for reliable packet transmission in on-chip networks","authors":"Yiming Ouyang , Tianbao Zhang , Jianhua Li , Huaguo Liang","doi":"10.1016/j.mejo.2024.106425","DOIUrl":null,"url":null,"abstract":"<div><div>In deep submicron technology, integrated circuits are susceptible to various factors, leading to increased probabilities of chip failures. The routers within NoC, connecting processor cores, also experience elevated fault rates, thereby impacting normal communication between processors. Therefore, implementing fault-tolerant mechanisms in on-chip networks becomes particularly crucial. In this paper, we propose a fault-tolerant routing scheme to ensure the accurate transmission, injection, and ejection of packets, even in the event of router failures at any node in the NoC. We have enhanced the router architecture by integrating bypass controllers (BCs) to connect east–west and north–south links, and linking these BCs to the local. This modification enables uninterrupted communication between cores. Based on this architecture, we propose a straightforward routing algorithm aimed at minimizing detours and ensuring packet transmission along the shortest path , thus reducing transmission latency. Experimental results demonstrate that our proposed fault-tolerant scheme significantly enhances reliability under scenarios involving multiple faulty routers when compared to existing schemes.</div></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2024-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239124001292","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In deep submicron technology, integrated circuits are susceptible to various factors, leading to increased probabilities of chip failures. The routers within NoC, connecting processor cores, also experience elevated fault rates, thereby impacting normal communication between processors. Therefore, implementing fault-tolerant mechanisms in on-chip networks becomes particularly crucial. In this paper, we propose a fault-tolerant routing scheme to ensure the accurate transmission, injection, and ejection of packets, even in the event of router failures at any node in the NoC. We have enhanced the router architecture by integrating bypass controllers (BCs) to connect east–west and north–south links, and linking these BCs to the local. This modification enables uninterrupted communication between cores. Based on this architecture, we propose a straightforward routing algorithm aimed at minimizing detours and ensuring packet transmission along the shortest path , thus reducing transmission latency. Experimental results demonstrate that our proposed fault-tolerant scheme significantly enhances reliability under scenarios involving multiple faulty routers when compared to existing schemes.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.