Comparative Analysis of the Surface Morphology of Dense Membrane Filters Pd95Pb5 and Pd93.5In6.0Ru0.5

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2024-09-26 DOI:10.1134/S1027451024700691

O. V. Akimova, T. P. Kaminskaya, S. V. Gorbunov

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Abstract

Surface morphology features of dense palladium-based membrane filters are studied using atomic force microscopy and scanning electron microscopy methods. Elemental compositions of the filters are Pd₉₅Pb₅ and Pd_93.5In_6.0Ru_0.5 (hereafter, numerical coefficients mean the composition in wt %). The thickness of the dense membrane filters is 50 and 70 µm, respectively. High-purity metal samples are obtained by methods of electric arc fusion in a protective atmosphere and cold rolling with intermediate vacuum annealing. There are differences in morphology of the filter surface due to the elemental composition of the alloys. Manifestations of cavitation in the form of µm-sized funnels are found upon palladium doping with lead, and there are no such funnels for palladium alloyed with indium and ruthenium. Differences in the surface roughness of the samples are revealed. Surface areas of different hardness are detected using atomic force microscopy in the lateral force contrast mode. The obtained results are important not only for the choice of material for the manufacture of membrane filters with improved performance characteristics but also for the development of the elemental composition of membrane filters in order to optimize their operation in high-tech modern technological processes.

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掺杂膜过滤器 Pd95Pb5 和 Pd93.5In6.0Ru0.5 的表面形态对比分析

使用原子力显微镜和扫描电子显微镜方法研究了致密钯基膜过滤器的表面形态特征。过滤器的元素组成分别为 Pd95Pb5 和 Pd93.5In6.0Ru0.5（以下数字系数表示成分的重量百分比）。致密膜过滤器的厚度分别为 50 微米和 70 微米。高纯度金属样品是通过保护气氛下的电弧熔融和中间真空退火的冷轧方法获得的。由于合金的元素组成不同，过滤器表面的形态也存在差异。在钯中掺入铅时，会出现微米大小的漏斗状空化现象，而在钯中掺入铟和钌时，则不会出现漏斗状空化现象。样品表面粗糙度的差异也显现出来。在横向力对比模式下，使用原子力显微镜检测了不同硬度的表面区域。所获得的结果不仅对选择制造性能更佳的膜过滤器的材料具有重要意义，而且对开发膜过滤器的元素组成以优化其在高科技现代工艺流程中的运行也具有重要意义。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.