Development of a Vector Magnet Based on High-Temperature Superconductors for Working with Polarized Neutrons

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
A. V. Altynov, A. P. Buzdavin, V. I. Bodnarchuk, V. D. Zhaketov, A. V. Petrenko, M. D. Proyavin, A. N. Chernikov
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引用次数: 0

Abstract

Polarized neutron reflectometry is an experimental method for studying metallic thin heterophase layered materials, polymer films, biological systems, the free surfaces of liquids, and magnetic fluids. It requires experimental equipment that includes a special magnetic system. The magnetic system described in this work, a vector magnet, will allow one to change the direction of the magnetic field in three directions, to place a temperature-control device inside at low and ultra-low temperatures, and will have an aperture that allows one to place a system for detecting neutrons and gamma rays outside. According to calculations, the cryomagnet will allow the application of a maximum field in the vertical plane of up to 3 T, and in the horizontal plane of up to 1 T. To manufacture a vector magnet, in this work, it is proposed to use a tape made of a high-temperature superconductor with a width of 4 mm. A cryostat with a vector magnet will be installed at the REMUR reflectometer on the eighth channel of the IBR-2 reactor.

Abstract Image

开发基于高温超导体的矢量磁体,用于偏振中子工作
偏振中子反射仪是一种研究金属薄异相层状材料、聚合物薄膜、生物系统、液体自由表面和磁性流体的实验方法。它需要包括特殊磁性系统在内的实验设备。这项工作中描述的磁性系统是一种矢量磁铁,可以在三个方向上改变磁场的方向,可以在低温和超低温下在内部放置温度控制装置,并且有一个孔,可以在外部放置探测中子和伽马射线的系统。根据计算,该低温磁体在垂直面上的最大磁场可达 3 T,在水平面上的最大磁场可达 1 T。带有矢量磁铁的低温恒温器将安装在 IBR-2 反应堆第八通道的 REMUR 反射仪上。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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