Electron microscopy of seismic waves

Abstract

Changes in the surrounding environment, if transmitted to the electron microscope, are frequently perceived as noise that diminishes the quality of the images. However, in fact, ‘noises’ contain rich information about the environment. This work reports a very rare event where aberration-corrected HAADF-STEM images were acquired during the impact of seismic waves, resulted from a mild earthquake. By analysing these images, we found that the drift and vibration of the sample are detectable and quantifiable. Despite many potential challenges, this work demonstrates the utilisation of electron microscopes in detecting and monitoring seismic waves with high spatial resolution, which may lead to unique applications in the low-frequency regime.