Development of wheat-tetraploid Thinopyrum elongatum 4EL small fragment translocation lines with stripe rust resistance gene Yr4EL.

IF 4.4 1区 农林科学 Q1 AGRONOMY
Biran Gong, Jing Gao, Yangqiu Xie, Hao Zhang, Wei Zhu, Lili Xu, Yiran Cheng, Yi Wang, Jian Zeng, Xing Fan, Lina Sha, Haiqin Zhang, Yonghong Zhou, Dandan Wu, Yinghui Li, Houyang Kang
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引用次数: 0

Abstract

Key message: Two small fragment translocation lines (T4DS·4DL-4EL and T5AS·5AL-4EL) showed high resistance to stripe rust and resistance gene Yr4EL was localized to an about 35 Mb region at the end of chr arm 4EL. Stripe rust, caused by the fungus Puccinia striiformis f. sp. tritici, is a devastating wheat disease worldwide. Deployment of disease resistance (R) genes in wheat cultivars is the most effective way to control the disease. Previously, the all-stage stripe rust R gene Yr4EL from tetraploid Thinopyrum elongatum was introduced into common wheat as 4E(4D) substitution and T4DS·4EL translocation lines. To further map and utilize Yr4EL, Chinese Spring (CS) mutant pairing homoeologous gene ph1b was used in crossing to induce recombination between chromosome (chr) 4EL and wheat chromosomes. Two small fragment translocation lines T4DS·4DL-4EL and T5AS·5AL-4EL with Yr4EL resistance were selected using molecular markers and confirmed by genomic in situ hybridization (GISH), fluorescence in situ hybridization (FISH), and Wheat 660 K SNP array analyses. We mapped Yr4EL to an about 35 Mb region at the end of chr 4EL, corresponding to 577.76-612.97 Mb based on the diploid Th. elongatum reference genome. In addition, two competitive allele-specific PCR (KASP) markers co-segregating with Yr4EL were developed to facilitate molecular marker-assisted selection in breeding. The T4DS·4DL-4EL lines were crossed and backcrossed with wheat cultivars SM482 and CM42, and the resulting pre-breeding lines showed high stripe rust resistance and potential for wheat breeding with good agronomic traits. These lines represent new germplasm for wheat stripe rust resistance breeding, as well as providing a solid foundation for Yr4EL fine mapping and cloning.

开发具有条锈病抗性基因 Yr4EL 的小麦四倍体 Thinopyrum elongatum 4EL 小片段易位系。
关键信息:两个小片段易位系(T4DS-4DL-4EL和T5AS-5AL-4EL)对条锈病表现出高度抗性,抗性基因Yr4EL定位在chr臂4EL末端约35 Mb的区域。由条锈病真菌 Puccinia striiformis f. sp. tritici 引起的条锈病是一种全球性的毁灭性小麦病害。在小麦栽培品种中部署抗病(R)基因是控制该病害的最有效方法。此前,四倍体 Thinopyrum elongatum 的全阶段条锈病 R 基因 Yr4EL 以 4E(4D) 替代系和 T4DS-4EL 易位系的形式被引入普通小麦。为了进一步绘制和利用 Yr4EL,在杂交中使用了中国春(CS)突变体配对同源基因 ph1b,以诱导染色体(chr)4EL 与小麦染色体之间的重组。利用分子标记筛选出了两个具有抗Yr4EL能力的小片段易位系T4DS-4DL-4EL和T5AS-5AL-4EL,并通过基因组原位杂交(GISH)、荧光原位杂交(FISH)和小麦660 K SNP阵列分析进行了确认。我们将 Yr4EL 映射到 chr 4EL 末端约 35 Mb 的区域,根据二倍体 Th. elongatum 的参考基因组,该区域对应于 577.76-612.97 Mb。此外,还开发了两个与 Yr4EL 共分离的竞争性等位基因特异性 PCR(KASP)标记,以促进育种中的分子标记辅助选择。T4DS-4DL-4EL 株系与小麦栽培品种 SM482 和 CM42 进行了杂交和回交,育成的预育种株系表现出较高的条锈病抗性和良好的农艺性状,具有进行小麦育种的潜力。这些品系代表了小麦抗条锈病育种的新种质,同时也为 Yr4EL 的精细作图和克隆奠定了坚实的基础。
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来源期刊
CiteScore
9.60
自引率
7.40%
发文量
241
审稿时长
2.3 months
期刊介绍: Theoretical and Applied Genetics publishes original research and review articles in all key areas of modern plant genetics, plant genomics and plant biotechnology. All work needs to have a clear genetic component and significant impact on plant breeding. Theoretical considerations are only accepted in combination with new experimental data and/or if they indicate a relevant application in plant genetics or breeding. Emphasizing the practical, the journal focuses on research into leading crop plants and articles presenting innovative approaches.
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