Investigation of Non-Linearities in Medical Ultrasound Imaging Probes by Characterizing Free and Clamped Capacitances

Thong Huynh;Trym Haakon Eggen;Lars Hoff
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Abstract

Tissue harmonic imaging requires good control of the nonlinearity in the ultrasound probe, as transmitted second harmonics from the probe may interfere with tissue harmonics and degrade image quality. We have studied the nonlinearity in four different medical ultrasound probes by measuring the capacitive part of their electrical impedances under varying electric fields, at frequencies well below and above the resonances. The probes were made with two different piezoelectric materials, piezoceramic PZT and single-crystal PMN-PT, with either soft backing operating at half-wavelength resonance or hard backing operating at quarter-wavelength resonance. When the applied electric field amplitude E was increased from $\mathrm {0.05~V/\mu m}$ to $\mathrm {0.5~V/\mu m}$ , we observed an increase in both the capacitance at high frequency, interpreted as clamped conditions, and at low frequency, interpreted as free conditions. This is a nonlinear phenomenon as these capacitances will not change in the linear regime. The increase in free capacitance was from 4 to 10 times larger than the increase in clamped capacitance for all the investigated probes. This indicates a stronger nonlinearity for the free capacitance. At the low-frequency excitation, we observed distortion in the current passing through the acoustic stack corresponding to a relative second harmonic level of −20 dB. We conclude that the nonlinear impedance of the acoustic stack in the investigated probes was primarily caused by nonlinearities in the mechanical coefficients, while contributions from dielectric nonlinearity were negligible.
通过分析自由电容和钳位电容研究医用超声波成像探头的非线性特性
组织谐波成像需要很好地控制超声探头的非线性,因为探头传输的二次谐波可能会干扰组织谐波并降低图像质量。我们研究了四种不同医用超声探头的非线性,方法是在不同电场下测量其电阻抗的电容部分,频率远远低于和高于共振频率。探头由两种不同的压电材料(压电陶瓷 PZT 和单晶 PMN-PT)制成,软衬底在半波长共振时工作,硬衬底在四分之一波长共振时工作。当外加电场振幅 E 从 $\mathrm {0.05~V/\mu m}$ 增加到 $\mathrm {0.5~V/\mu m}$ 时,我们观察到电容在高频(解释为箝位条件)和低频(解释为自由条件)下都有所增加。这是一种非线性现象,因为这些电容在线性状态下不会发生变化。在所有研究的探头中,自由电容的增幅是钳位电容增幅的 4 到 10 倍。这表明自由电容的非线性更强。在低频激励下,我们观察到通过声学叠层的电流失真,相当于 -20 dB 的相对二次谐波电平。我们得出结论,在所研究的探头中,声学叠层的非线性阻抗主要是由机械系数的非线性引起的,而介质非线性的影响可以忽略不计。
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