Disi Lin , Chuandong Chen , Rongshan Wei , Qinghai Liu , Huan He , Ziran Zhu , Zhifeng Lin , Jianli Chen
{"title":"Two stage Ordered Escape Routing combined with LP and heuristic algorithm for large scaled PCB","authors":"Disi Lin , Chuandong Chen , Rongshan Wei , Qinghai Liu , Huan He , Ziran Zhu , Zhifeng Lin , Jianli Chen","doi":"10.1016/j.vlsi.2024.102270","DOIUrl":null,"url":null,"abstract":"<div><div>The Ordered Escape Routing (OER) problem, which is an NP-hard problem, is critical to PCB design. Primary methods based on integer linear programming (ILP) work well on small-scale PCBs with fewer pins. However, when dealing with large-scale instances, traditional ILP strategies frequently cause time violations as the number of variables increases due to time-consuming preprocessing. In addition, heuristic algorithms have a time advantage when dealing with specific problems. In this paper, We propose an efficient two-stage escape routing method that employs LP for global routing and uses a heuristic algorithm to deal with the path intersection problem to minimize wiring length and runtime for large-scale PCBs. We first model the OER problem as a min-cost multi-commodity flow problem and use ILP to solve it. Then, we relax the non-crossing constraints and transform the ILP model into an LP model to reduce the runtime. we also construct a crossing graph according to the intersection of routing paths and propose a heuristic algorithm to locate congestion quickly. Finally, we reduce the local area capacity and allow global automatic congestion optimization. Compared with the state-of-the-art work, experimental results show that our method can reduce the routing time by 60% and handle larger-scale PCB escape routing problems.</div></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":null,"pages":null},"PeriodicalIF":2.2000,"publicationDate":"2024-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926024001342","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
The Ordered Escape Routing (OER) problem, which is an NP-hard problem, is critical to PCB design. Primary methods based on integer linear programming (ILP) work well on small-scale PCBs with fewer pins. However, when dealing with large-scale instances, traditional ILP strategies frequently cause time violations as the number of variables increases due to time-consuming preprocessing. In addition, heuristic algorithms have a time advantage when dealing with specific problems. In this paper, We propose an efficient two-stage escape routing method that employs LP for global routing and uses a heuristic algorithm to deal with the path intersection problem to minimize wiring length and runtime for large-scale PCBs. We first model the OER problem as a min-cost multi-commodity flow problem and use ILP to solve it. Then, we relax the non-crossing constraints and transform the ILP model into an LP model to reduce the runtime. we also construct a crossing graph according to the intersection of routing paths and propose a heuristic algorithm to locate congestion quickly. Finally, we reduce the local area capacity and allow global automatic congestion optimization. Compared with the state-of-the-art work, experimental results show that our method can reduce the routing time by 60% and handle larger-scale PCB escape routing problems.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.