Coupled mode theory-based analytical model of a ring resonator refractive index sensor incorporating bending loss and dispersion

Abstract

This paper presents an analytical model of a silicon nitride-based 2D ring resonator refractive index (RI) sensor using coupled mode theory (CMT). The proposed model decomposes the ring resonator into two coupling regions and employs coupled-mode equations to describe input and output amplitudes via scattering matrix analysis. The proposed sensor, operating with varying refractive indices in the background cladding, demonstrates a sensitivity of 218 nm/RIU and a total quality factor of 1198. A comprehensive analysis of the bending loss in the proposed sensor is conducted, elucidating its impact on sensitivity, coupling quality factor, and intrinsic quality factor. This analysis aids in the selection of optimal ring resonator parameters, including radius, width, and gap, to achieve superior sensing performance. Furthermore, the paper examines the effect of dispersion on sensitivity and quality and compares the results with those obtained from CMT-based silicon core ring resonator and disk resonator RI sensors. This study provides valuable insights for the design and optimization of high-performance silicon nitride-based RI sensors for various applications.