Fanout-Based Reliability Model for SER Estimation in Combinational Circuits

IF 5.2 1区工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Circuits and Systems I: Regular Papers Pub Date : 2024-09-18 DOI:10.1109/tcsi.2024.3458864

Esfandiar Esmaieli, Yasser Sedaghat, Ali Peiravi

引用次数: 0

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用于组合电路 SER 估计的基于扇出的可靠性模型

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Transactions on Circuits and Systems I: Regular Papers 工程技术-工程：电子与电气

CiteScore

9.80

自引率

11.80%

发文量

441

审稿时长

2 months

期刊介绍： TCAS I publishes regular papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes: - Circuits: Analog, Digital and Mixed Signal Circuits and Systems - Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic - Circuits and Systems, Power Electronics and Systems - Software for Analog-and-Logic Circuits and Systems - Control aspects of Circuits and Systems.