Unveiling the unseen: novel strategies for object detection beyond known distributions

IF 3.7 4区 计算机科学 Q2 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE
S. Devi, R. Dayana, P. Malarvezhi
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引用次数: 0

Abstract

In contemporary machine learning, models often struggle with data distribution variations, severely impacting their out-of-distribution (OOD) generalization and detection capabilities. Current object detection methods, relying on virtual outlier synthesis and class-conditional density estimation, struggle to effectively distinguish OOD samples. They often depend on accurate density estimation and may produce virtual outliers that lack realism, particularly in complex or dynamic environments. Furthermore, previous research has typically addressed covariate and semantic shifts independently, resulting in fragmented solutions that fail to comprehensively tackle OOD generalization. This study introduces a unified approach to enhance OOD generalization in object recognition models, addressing these critical gaps. The strategy involves employing adversarial perturbations on the ID (In-Distribution) dataset to enhance the model’s resilience to distribution shifts, thereby simulating potential real-world scenarios characterized by imperceptible variations. Additionally, the integration of Maximum Mean Discrepancy (MMD) at the object level effectively discriminates between ID and OOD samples by quantifying distributional differences. For precise OOD detection, a K-nearest neighbors (KNN) algorithm is used during inference to measure similarity between samples and their closest neighbors in the training data. Evaluations on benchmark datasets, including PASCAL VOC and BDD100K as ID, with COCO and Open Images subsets as OOD, demonstrate significant improvements in OOD generalization compared to existing methods. These discoveries underscore the framework’s potential to elevate the dependability and flexibility of object recognition systems in practical scenarios, particularly in autonomous vehicles where accurate object detection under diverse conditions is critical for safety. This research contributes to advancing OOD generalization techniques and lays the groundwork for future refinement to address evolving challenges in machine learning applications. The code can be accessed from https://github.com/DeviSPhd/\(OODG\_OD\)

Abstract Image

揭开看不见的面纱:已知分布之外的物体检测新策略
在当代机器学习中,模型往往难以应对数据分布的变化,严重影响其分布外(OOD)泛化和检测能力。目前的物体检测方法依赖于虚拟离群值合成和类条件密度估计,很难有效区分 OOD 样本。它们通常依赖于精确的密度估计,并可能产生缺乏真实感的虚拟异常值,尤其是在复杂或动态环境中。此外,以往的研究通常将协变量和语义偏移分开处理,导致解决方案支离破碎,无法全面解决 OOD 泛化问题。本研究引入了一种统一的方法来增强物体识别模型中的 OOD 泛化,以弥补这些关键的不足。该策略包括在 ID(分布内)数据集上采用对抗性扰动,以增强模型对分布变化的适应能力,从而模拟以难以察觉的变化为特征的潜在真实世界场景。此外,在对象层面整合最大均值差异(MMD),通过量化分布差异有效区分 ID 和 OOD 样本。为了精确检测 OOD,在推理过程中使用了 K-nearest neighbors(KNN)算法来测量样本与其训练数据中的近邻之间的相似性。在基准数据集(包括作为 ID 的 PASCAL VOC 和 BDD100K,以及作为 OOD 的 COCO 和 Open Images 子集)上进行的评估表明,与现有方法相比,OOD 的泛化能力有了显著提高。这些发现凸显了该框架在提高实际场景中物体识别系统的可靠性和灵活性方面的潜力,特别是在自动驾驶汽车中,不同条件下的精确物体检测对安全至关重要。这项研究有助于推动 OOD 泛化技术的发展,并为未来的改进奠定基础,以应对机器学习应用中不断变化的挑战。代码可从 https://github.com/DeviSPhd/\(OODG\_OD\) 访问。
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来源期刊
Pattern Analysis and Applications
Pattern Analysis and Applications 工程技术-计算机:人工智能
CiteScore
7.40
自引率
2.60%
发文量
76
审稿时长
13.5 months
期刊介绍: The journal publishes high quality articles in areas of fundamental research in intelligent pattern analysis and applications in computer science and engineering. It aims to provide a forum for original research which describes novel pattern analysis techniques and industrial applications of the current technology. In addition, the journal will also publish articles on pattern analysis applications in medical imaging. The journal solicits articles that detail new technology and methods for pattern recognition and analysis in applied domains including, but not limited to, computer vision and image processing, speech analysis, robotics, multimedia, document analysis, character recognition, knowledge engineering for pattern recognition, fractal analysis, and intelligent control. The journal publishes articles on the use of advanced pattern recognition and analysis methods including statistical techniques, neural networks, genetic algorithms, fuzzy pattern recognition, machine learning, and hardware implementations which are either relevant to the development of pattern analysis as a research area or detail novel pattern analysis applications. Papers proposing new classifier systems or their development, pattern analysis systems for real-time applications, fuzzy and temporal pattern recognition and uncertainty management in applied pattern recognition are particularly solicited.
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