Honghui Wang , Tong Liu , Xiang Wang , Xike Yang , Yuhang Wang , Yiru Wang , Shangkun Zeng , Jizhou Ren
{"title":"Spatial resolution improvement method of RDTS assisted by small-scale thermal region length recognition model","authors":"Honghui Wang , Tong Liu , Xiang Wang , Xike Yang , Yuhang Wang , Yiru Wang , Shangkun Zeng , Jizhou Ren","doi":"10.1016/j.yofte.2024.103967","DOIUrl":null,"url":null,"abstract":"<div><p>The Total Variation Deconvolution (TVD) algorithm plays an important role in signal reconstruction, however, when it is used to improve the spatial resolution of Raman Distributed Temperature Sensor (RDTS), there are certain challenges in parameter settings. This paper proposes to use Fully-Connected Neural Network to identify the length of small-scale thermal regions(SSTR), and based on the recognition results to set the TVD parameters automatically. We constructed training sets based on the periodic changes of SSTR signals in RDTS (which we call Thermal Region Response Modes, TRRM), to verify performance, we conducted comparative experiments between models obtained from a training set containing 100 types of TRRMs and 25 types of TRRMs, the Macro-F1 value of the former one is 0.2749 higher, reaching 0.9087, performed well in SSTR length recognition tasks. the traditional TVD assisted by this model can increase the spatial resolution of RDTS from 1.6 m to 0.4 m without manual intervention, which complements the lack of automation in applications of TVD and has practical value.</p></div>","PeriodicalId":19663,"journal":{"name":"Optical Fiber Technology","volume":"88 ","pages":"Article 103967"},"PeriodicalIF":2.6000,"publicationDate":"2024-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Fiber Technology","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1068520024003122","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The Total Variation Deconvolution (TVD) algorithm plays an important role in signal reconstruction, however, when it is used to improve the spatial resolution of Raman Distributed Temperature Sensor (RDTS), there are certain challenges in parameter settings. This paper proposes to use Fully-Connected Neural Network to identify the length of small-scale thermal regions(SSTR), and based on the recognition results to set the TVD parameters automatically. We constructed training sets based on the periodic changes of SSTR signals in RDTS (which we call Thermal Region Response Modes, TRRM), to verify performance, we conducted comparative experiments between models obtained from a training set containing 100 types of TRRMs and 25 types of TRRMs, the Macro-F1 value of the former one is 0.2749 higher, reaching 0.9087, performed well in SSTR length recognition tasks. the traditional TVD assisted by this model can increase the spatial resolution of RDTS from 1.6 m to 0.4 m without manual intervention, which complements the lack of automation in applications of TVD and has practical value.
期刊介绍:
Innovations in optical fiber technology are revolutionizing world communications. Newly developed fiber amplifiers allow for direct transmission of high-speed signals over transcontinental distances without the need for electronic regeneration. Optical fibers find new applications in data processing. The impact of fiber materials, devices, and systems on communications in the coming decades will create an abundance of primary literature and the need for up-to-date reviews.
Optical Fiber Technology: Materials, Devices, and Systems is a new cutting-edge journal designed to fill a need in this rapidly evolving field for speedy publication of regular length papers. Both theoretical and experimental papers on fiber materials, devices, and system performance evaluation and measurements are eligible, with emphasis on practical applications.