Learning Scatter Artifact Correction in Cone-Beam X-Ray CT Using Incomplete Projections with Beam Hole Array

IF 2.6 3区 材料科学 Q2 MATERIALS SCIENCE, CHARACTERIZATION & TESTING
Haruki Hattori, Tatsuya Yatagawa, Yutaka Ohtake, Hiromasa Suzuki
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引用次数: 0

Abstract

X-ray cone-beam computed tomography (CBCT) is a powerful tool for nondestructive testing and evaluation, yet the CT image quality can be compromised by artifact due to X-ray scattering within dense materials such as metals. This problem leads to the need for hardware- and software-based scatter artifact correction to enhance the image quality. Recently, deep learning techniques have merged as a promising approach to obtain scatter-free images efficiently. However, these deep learning techniques rely heavily on training data, often gathered through simulation. Simulated CT images, unfortunately, do not accurately reproduce the real properties of objects, and physically accurate X-ray simulation still requires significant computation time, hindering the collection of a large number of CT images. To address these problems, we propose a deep learning framework for scatter artifact correction using projections obtained solely by real CT scanning. To this end, we utilize a beam-hole array (BHA) to block the X-rays deviating from the primary beam path, thereby capturing scatter-free X-ray intensity at certain detector pixels. As the BHA shadows a large portion of detector pixels, we incorporate several regularization losses to enhance the training process. Furthermore, we introduce radiographic data augmentation to mitigate the need for long scanning time, which is a concern as CT devices equipped with BHA require two series of CT scans. Experimental validation showed that the proposed framework outperforms a baseline method that learns simulated projections where the entire image is visible and does not contain scattering artifacts.

Abstract Image

利用光束孔阵列的不完整投影在锥形束 X 射线 CT 中学习散射伪影校正
X 射线锥束计算机断层扫描(CBCT)是一种用于无损检测和评估的强大工具,但由于 X 射线在金属等致密材料中的散射,CT 图像质量可能会受到伪影的影响。这一问题导致需要基于硬件和软件的散射伪影校正来提高图像质量。最近,深度学习技术作为一种很有前途的方法,被用于高效获取无散射图像。然而,这些深度学习技术在很大程度上依赖于通常通过模拟收集的训练数据。遗憾的是,模拟 CT 图像无法准确再现物体的真实属性,而物理上精确的 X 射线模拟仍然需要大量的计算时间,这阻碍了大量 CT 图像的收集。为了解决这些问题,我们提出了一种深度学习框架,利用仅通过真实 CT 扫描获得的投影进行散射伪影校正。为此,我们利用光束孔阵列(BHA)来阻挡偏离主光束路径的 X 射线,从而捕捉某些探测器像素的无散射 X 射线强度。由于光束孔阵列遮挡了大部分探测器像素,我们采用了几种正则化损失来增强训练过程。此外,我们还引入了放射数据增强技术,以减少对长扫描时间的需求,因为配备 BHA 的 CT 设备需要进行两轮 CT 扫描。实验验证表明,所提出的框架优于学习模拟投影的基线方法,在模拟投影中,整个图像是可见的,不包含散射伪影。
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来源期刊
Journal of Nondestructive Evaluation
Journal of Nondestructive Evaluation 工程技术-材料科学:表征与测试
CiteScore
4.90
自引率
7.10%
发文量
67
审稿时长
9 months
期刊介绍: Journal of Nondestructive Evaluation provides a forum for the broad range of scientific and engineering activities involved in developing a quantitative nondestructive evaluation (NDE) capability. This interdisciplinary journal publishes papers on the development of new equipment, analyses, and approaches to nondestructive measurements.
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