V. A. Shvets, D. V. Marin, M. V. Yakushev, S. V. Rykhiitskii
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引用次数: 0
Abstract
In this work, the spectra of optical constants of epitaxial layers of cadmium telluride near the fundamental absorption edge are studied. For this purpose, ellipsometric measurements of the layers under study were carried out in a vacuum chamber in the temperature range from T = 38–275°C. A numerical algorithm has been developed for solving the inverse ellipsometry problem for the structures under consideration, with the help of which the spectral dependences of the refractive index n(λ) and absorption index k(λ) are determined in the wavelength range from 700 to 1000 nm. The parametric dependences of k(λ, T) in the fundamental absorption region and in the transparency region are presented. The presence of an extended absorption tail in the transparency region was established, presumably associated with imperfections in the crystal structure.
期刊介绍:
Optics and Spectroscopy (Optika i spektroskopiya), founded in 1956, presents original and review papers in various fields of modern optics and spectroscopy in the entire wavelength range from radio waves to X-rays. Topics covered include problems of theoretical and experimental spectroscopy of atoms, molecules, and condensed state, lasers and the interaction of laser radiation with matter, physical and geometrical optics, holography, and physical principles of optical instrument making.