A. Amato, M. Bazzan, G. Cagnoli, M. Canepa, M. Coulon, J. Degallaix, N. Demos, M. Evans, F. Fabrizi, G. Favaro, D. Forest, S. Gras, D. Hofman, A. Lemaitre, G. Maggioni, M. Magnozzi, V. Martinez, L. Mereni, C. Michel, V. Milotti, M. Montani, A. Paolone, A. Pereira, F. Piergiovanni, V. Pierro, L. Pinard, I. M. Pinto, E. Placidi, S. Samandari, B. Sassolas, N. Shcheblanov, J. Teillon, I. Vickridge, M. Granata
{"title":"Development of ion-beam sputtered silicon nitride thin films for low-noise mirror coatings of gravitational-wave detectors","authors":"A. Amato, M. Bazzan, G. Cagnoli, M. Canepa, M. Coulon, J. Degallaix, N. Demos, M. Evans, F. Fabrizi, G. Favaro, D. Forest, S. Gras, D. Hofman, A. Lemaitre, G. Maggioni, M. Magnozzi, V. Martinez, L. Mereni, C. Michel, V. Milotti, M. Montani, A. Paolone, A. Pereira, F. Piergiovanni, V. Pierro, L. Pinard, I. M. Pinto, E. Placidi, S. Samandari, B. Sassolas, N. Shcheblanov, J. Teillon, I. Vickridge, M. Granata","doi":"arxiv-2409.07147","DOIUrl":null,"url":null,"abstract":"Brownian thermal noise of thin-film coatings is a fundamental limit for\nhigh-precision experiments based on optical resonators such as\ngravitational-wave interferometers. Here we present the results of a research\nactivity aiming to develop lower-noise ion-beam sputtered silicon nitride thin\nfilms compliant with the very stringent requirements on optical loss of\ngravitational-wave interferometers. In order to test the hypothesis of a correlation between the synthesis\nconditions of the films and their elemental composition and optical and\nmechanical properties, we varied the voltage, current intensity and composition\nof the sputtering ion beam, and we performed a broad campaign of\ncharacterizations. While the refractive index was found to monotonically depend\non the beam voltage and linearly vary with the N/Si ratio, the optical\nabsorption appeared to be strongly sensitive to other factors, as yet\nunidentified. However, by systematically varying the deposition parameters, an\noptimal working point was found. Thus we show that the loss angle and\nextinction coefficient of our thin films can be as low as $(1.0 \\pm 0.1) \\times\n10^{-4}$ rad at $\\sim$2.8 kHz and $(6.4 \\pm 0.2) \\times 10^{-6}$ at 1064 nm,\nrespectively, after thermal treatment at 900 $^{\\circ}$C. Such loss angle value\nis the lowest ever measured on this class of thin films. We then used our silicon nitride thin films to design and produce a\nmulti-material mirror coating showing a thermal noise amplitude of $(10.3 \\pm\n0.2) \\times 10^{-18}$ m Hz$^{-1/2}$ at 100 Hz, which is 25\\% lower than in\ncurrent mirror coatings of the Advanced LIGO and Advanced Virgo\ninterferometers, and an optical absorption as low as $(1.9 \\pm 0.2)$ parts per\nmillion at 1064 nm.","PeriodicalId":501374,"journal":{"name":"arXiv - PHYS - Instrumentation and Detectors","volume":"2 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv - PHYS - Instrumentation and Detectors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/arxiv-2409.07147","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Brownian thermal noise of thin-film coatings is a fundamental limit for
high-precision experiments based on optical resonators such as
gravitational-wave interferometers. Here we present the results of a research
activity aiming to develop lower-noise ion-beam sputtered silicon nitride thin
films compliant with the very stringent requirements on optical loss of
gravitational-wave interferometers. In order to test the hypothesis of a correlation between the synthesis
conditions of the films and their elemental composition and optical and
mechanical properties, we varied the voltage, current intensity and composition
of the sputtering ion beam, and we performed a broad campaign of
characterizations. While the refractive index was found to monotonically depend
on the beam voltage and linearly vary with the N/Si ratio, the optical
absorption appeared to be strongly sensitive to other factors, as yet
unidentified. However, by systematically varying the deposition parameters, an
optimal working point was found. Thus we show that the loss angle and
extinction coefficient of our thin films can be as low as $(1.0 \pm 0.1) \times
10^{-4}$ rad at $\sim$2.8 kHz and $(6.4 \pm 0.2) \times 10^{-6}$ at 1064 nm,
respectively, after thermal treatment at 900 $^{\circ}$C. Such loss angle value
is the lowest ever measured on this class of thin films. We then used our silicon nitride thin films to design and produce a
multi-material mirror coating showing a thermal noise amplitude of $(10.3 \pm
0.2) \times 10^{-18}$ m Hz$^{-1/2}$ at 100 Hz, which is 25\% lower than in
current mirror coatings of the Advanced LIGO and Advanced Virgo
interferometers, and an optical absorption as low as $(1.9 \pm 0.2)$ parts per
million at 1064 nm.