Investigation of Strontium/Barium Silicate Glasses through MCNPX and Phy-X for X-rays Shielding

IF 2.8 3区 材料科学 Q3 CHEMISTRY, PHYSICAL
Silicon Pub Date : 2024-08-22 DOI:10.1007/s12633-024-03109-2
Afreen Alam, Shaukat Ali Khattak, Gul Rooh, Hasan B. Albargi, Arshad Khan, Nadeem Khan, Irfan Ullah, Syed Zulfiqar, Tahirzeb Khan, Gulzar Khan
{"title":"Investigation of Strontium/Barium Silicate Glasses through MCNPX and Phy-X for X-rays Shielding","authors":"Afreen Alam,&nbsp;Shaukat Ali Khattak,&nbsp;Gul Rooh,&nbsp;Hasan B. Albargi,&nbsp;Arshad Khan,&nbsp;Nadeem Khan,&nbsp;Irfan Ullah,&nbsp;Syed Zulfiqar,&nbsp;Tahirzeb Khan,&nbsp;Gulzar Khan","doi":"10.1007/s12633-024-03109-2","DOIUrl":null,"url":null,"abstract":"<div><p>We study the radiation shielding properties 40X-60SiO<sub>2</sub> glasses, where X represents either SrO or BaO, while using MCNPX simulations code and Phy-X software by assessing radiation shielding parameters such as mass and linear attenuation shielding parameters, mean free path, half-value layer, effective atomic number, and tenth value layer in the photon energy ranging from 0.001 to 15 MeV. The result obtained for the mass attenuation coefficient is used to determine the half-value layer (HVL), mean free path (MFP), tenth value layer (TVL), and effective atomic number (Z<sub>eff</sub>). Both mass attenuation coefficient results obtained for MCNPX and Phy-X demonstrate a high degree of agreement with each other. The half-value layer for 40BaO-60SiO<sub>2</sub> is found to be increasing from 0.004 cm to 5.01 cm with the increasing the photon energy from 0.015 to 15 MeV, while for 40SrO-60SiO<sub>2</sub> it increases from 0.01 cm to 7.19 cm in the same energy range. Similarly, the mean free path for 40BaO-60SiO<sub>2</sub> increases from 0.006 cm to 7.23 cm with increasing energy from 0.015 to 15 MeV while it increases from 0.02 cm to 10.37 cm for 40SrO-60SiO<sub>2</sub> in the same energy range. The lower half-value layer and mean free path for 40BaO-60SiO<sub>2</sub> than for 40SrO-60SiO<sub>2</sub> in the entire energy range is attributed to the higher density of Ba in 40BaO-60SiO<sub>2</sub> than that of Sr in the 40SrO-60SiO<sub>2</sub>. The higher mass- and linear-attenuation coefficients and lower half- and tenth-value layers and mean free path for 40BaO-60SiO<sub>2</sub> (with higher density) than for 40SrO-60SiO<sub>2</sub> (with lower density) suggest that 40BaO-60SiO<sub>2</sub> is more efficient in shielding the X-rays than the 40SrO-60SiO<sub>2</sub>. Therefore, it is inferred that 40BaO-60SiO<sub>2</sub> glass can be used as a potential shielding material for medical applications such as in X-ray rooms and radiation therapy.</p></div>","PeriodicalId":776,"journal":{"name":"Silicon","volume":"16 16","pages":"5833 - 5839"},"PeriodicalIF":2.8000,"publicationDate":"2024-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Silicon","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1007/s12633-024-03109-2","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0

Abstract

We study the radiation shielding properties 40X-60SiO2 glasses, where X represents either SrO or BaO, while using MCNPX simulations code and Phy-X software by assessing radiation shielding parameters such as mass and linear attenuation shielding parameters, mean free path, half-value layer, effective atomic number, and tenth value layer in the photon energy ranging from 0.001 to 15 MeV. The result obtained for the mass attenuation coefficient is used to determine the half-value layer (HVL), mean free path (MFP), tenth value layer (TVL), and effective atomic number (Zeff). Both mass attenuation coefficient results obtained for MCNPX and Phy-X demonstrate a high degree of agreement with each other. The half-value layer for 40BaO-60SiO2 is found to be increasing from 0.004 cm to 5.01 cm with the increasing the photon energy from 0.015 to 15 MeV, while for 40SrO-60SiO2 it increases from 0.01 cm to 7.19 cm in the same energy range. Similarly, the mean free path for 40BaO-60SiO2 increases from 0.006 cm to 7.23 cm with increasing energy from 0.015 to 15 MeV while it increases from 0.02 cm to 10.37 cm for 40SrO-60SiO2 in the same energy range. The lower half-value layer and mean free path for 40BaO-60SiO2 than for 40SrO-60SiO2 in the entire energy range is attributed to the higher density of Ba in 40BaO-60SiO2 than that of Sr in the 40SrO-60SiO2. The higher mass- and linear-attenuation coefficients and lower half- and tenth-value layers and mean free path for 40BaO-60SiO2 (with higher density) than for 40SrO-60SiO2 (with lower density) suggest that 40BaO-60SiO2 is more efficient in shielding the X-rays than the 40SrO-60SiO2. Therefore, it is inferred that 40BaO-60SiO2 glass can be used as a potential shielding material for medical applications such as in X-ray rooms and radiation therapy.

通过 MCNPX 和 Phy-X 研究用于 X 射线屏蔽的锶/钡硅酸盐玻璃
我们使用 MCNPX 仿真代码和 Phy-X 软件研究了 40X-60SiO2 玻璃(其中 X 代表 SrO 或 BaO)的辐射屏蔽特性,评估了光子能量范围从 0.001 到 15 MeV 的辐射屏蔽参数,如质量和线性衰减屏蔽参数、平均自由路径、半值层、有效原子序数和十值层。质量衰减系数的结果用于确定半值层(HVL)、平均自由路径(MFP)、十值层(TVL)和有效原子序数(Zeff)。MCNPX 和 Phy-X 的质量衰减系数结果显示出高度的一致性。随着光子能量从 0.015 兆电子伏增加到 15 兆电子伏,40BaO-60SiO2 的半值层从 0.004 厘米增加到 5.01 厘米,而 40SrO-60SiO2 的半值层在相同的能量范围内从 0.01 厘米增加到 7.19 厘米。同样,随着能量从 0.015 到 15 MeV 的增加,40BaO-60SiO2 的平均自由路径从 0.006 厘米增加到 7.23 厘米,而在相同的能量范围内,40SrO-60SiO2 的平均自由路径从 0.02 厘米增加到 10.37 厘米。在整个能量范围内,40BaO-60SiO2 的半值层和平均自由路径低于 40SrO-60SiO2,这是因为 40BaO-60SiO2 中 Ba 的密度高于 40SrO-60SiO2 中 Sr 的密度。与密度较低的 40SrO-60SiO2 相比,40BaO-60SiO2 的质量和线性衰减系数更高,半值和十值层以及平均自由路径更低,这表明 40BaO-60SiO2 比 40SrO-60SiO2 能更有效地屏蔽 X 射线。因此,可以推断 40BaO-60SiO2 玻璃可作为一种潜在的屏蔽材料用于医疗应用,如 X 射线室和放射治疗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Silicon
Silicon CHEMISTRY, PHYSICAL-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
5.90
自引率
20.60%
发文量
685
审稿时长
>12 weeks
期刊介绍: The journal Silicon is intended to serve all those involved in studying the role of silicon as an enabling element in materials science. There are no restrictions on disciplinary boundaries provided the focus is on silicon-based materials or adds significantly to the understanding of such materials. Accordingly, such contributions are welcome in the areas of inorganic and organic chemistry, physics, biology, engineering, nanoscience, environmental science, electronics and optoelectronics, and modeling and theory. Relevant silicon-based materials include, but are not limited to, semiconductors, polymers, composites, ceramics, glasses, coatings, resins, composites, small molecules, and thin films.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信